1. Pressure-induced metallization and enhanced photoelectric activity in layered tin disulfide.
- Author
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Shi, Yuyang, Wu, Min, Yue, Lei, Wang, Kai, Li, Quanjun, Wu, Ye, Ye, Gonglan, and Huang, Haijun
- Subjects
OPTICAL diffraction ,PHOTOELECTRICITY ,ELECTRICAL resistivity ,LIGHT absorption ,X-ray diffraction ,CHEMICAL properties ,TIN - Abstract
Two-dimensional layered metal dichalcogenides have given rise to considerable interest in electronics and optoelectronics fields because of their excellent physical and chemical properties and promising applications. Tin disulfide (SnS
2 ) is an important member of them due to its environment-friendly and resource-rich characteristics. Here, a series of in situ electrical transport experiments and photocurrent measurements under high pressure have been performed to investigate the electrical and opto-electrical properties of 4H-SnS2 . With increasing pressure, the electrical resistivity of 4H-SnS2 decrease significantly, leading to a transition from semiconducting to metallic state above 58.6 GPa. The increase in pressure results in a substantial enhancement in photoelectric activity, indicating the extensive potential of utilizing pressure as a trigger for in situ optoelectronic applications. Combined with our previous results of x-ray diffraction and optical absorption at high pressure, pressure-induced structural distortion, bandgap narrowing, metallization, and enhancement of photoelectric activity of 4H-SnS2 are tunable and reversible, which are of great significance for both fundamental research and device design. [ABSTRACT FROM AUTHOR]- Published
- 2024
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