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We discuss elemental abundances of noble gases in targets exposed to the solar wind (SW) onboard the “Genesis” mission during the three different SW “regimes”: “Slow” (interstream, IS) wind, “Fast” (coronal hole, CH) wind and solar wind related to coronal mass ejections (CME). To this end we first present new Ar, Kr, and Xe elemental abundance data in Si targets sampling the different regimes. We also discuss He, Ne, and Ar elemental and isotopic abundances obtained on Genesis regime targets partly published previously. Average Kr/Ar ratios for all three regimes are identical to each other within their uncertainties of about 1% with one exception: the Fast SW has a 12% lower Xe/Ar ratio than do the other two regimes. In contrast, the He/Ar and Ne/Ar ratios in the CME targets are higher by more than 20% and 10%, respectively, than the corresponding Fast and Slow SW values, which among themselves vary by no more than 2–4%. Earlier observations on lunar samples and Genesis targets sampling bulk SW wind had shown that Xe, with a first ionisation potential (FIP) of ∼12 eV, is enriched by about a factor of two in the bulk solar wind over Ar and Kr compared to photospheric abundances, similar to many “low FIP” elements with a FIP less than ∼10 eV. This behaviour of the “high FIP” element Xe was not easily explained, also because it has a Coulomb drag factor suggesting a relatively inefficient feeding into the SW acceleration region and hence a depletion relative to other high FIP elements such as Kr and Ar. The about 12% lower enrichment of Xe in Genesis’ Fast SW regime observed here is, however, in line with the hypothesis that the depletion of Xe in the SW due to the Coulomb drag effect is overcompensated as a result of the relatively short ionisation time of Xe in the ion-neutral separation region in the solar chromosphere. We will also discuss the rather surprising fact that He and Ne in CME targets are quite substantially enriched (by 20% and 10%, respectively) relative to the other solar wind regimes, but that this enrichment is not accompanied by an isotopic fractionation. The Ne isotopic data in CMEs are consistent with a previous hypothesis that isotopic fractionation in the solar wind is mass-dependent.

Electron probe microanalyzer measurements of trace elements with high accuracy are challenging. Accurate Al measurements in olivine are required to calibrate SIMS implant reference materials for measurement of Al in the solar wind. We adopt a combined EPMA/SIMS approach that is useful for producing SIMS reference materials as well as for EPMA at the ~100 μg g(−1) level. Even for mounts not polished with alumina photoelectron spectroscopy shows high levels of Al surface contamination. In order to minimize electron beam current density, a rastered 50 × 100 μm electron beam was adequate and minimized sensitivity to small Al-rich contaminants. Reproducible analyses of eleven SIMS-cleaned spots on San Carlos olivine agreed at 69.3 ± 1.0 μg g(−1)• The known Al mass fraction was used to calibrate an Al implant into San Carlos. Accurate measurements of Al were made for olivines in the pallasites: lmilac, Eagle Station and Springwater. Our focus was on Al in olivine, but our technique could be refined to give accurate electron probe measurements for other contamination-sensitive trace elements. For solar wind, it is projected that the Al/Mg abundance ratio can be determined to 6%, a factor of 2 more precise than the solar spectroscopic ratio.

The Genesis mission captured Solar Wind (SW) and delivered it to Earth for laboratory analyses. Due to advanced mass spectrometric techniques developed specifically for analyses of returned Genesis SW-collectors, SW-oxygen, nitrogen and noble gas isotopes have been successfully measured providing new insights for cosmo- and geochemistry. SW-Xe collected by Genesis is the heaviest and the least abundant SW element analyzed. Here we describe in detail the experimental improvements we made over last 5 years and a latest refined SW-Xe isotopic composition. Combined with earlier, already published SW-Xe analyses, our new results provide the best current estimate for SW-Xe collected by Genesis: 136Xe/130Xe = 1.818 ± 0.004; 134Xe/130Xe = 2.242 ± 0.005; 132Xe/130Xe = 6.063 ± 0.010; 131Xe/130Xe = 5.010 ± 0.012; 129Xe/130Xe = 6.314 ± 0.013; 128Xe/130Xe = 0.510 ± 0.001; 126Xe/130Xe = 0.0256 ± 0.0004; 124Xe/130Xe = 0.0292 ± 0.0004 (all errors are 1σ). The achieved precision allows resolving small, but now statistically significant isotopic difference between solar wind Xe and Xe trapped in lunar regolith samples. This emerging difference, not apparent prior to this study, likely points to the composition of indigenous lunar Xe and to the temporal evolution of terrestrial Xe. Combining our Xe fluence with that for other high first ionization potential (FIP) elements, we find that the depletion of elements with the FIP greater than 12 eV is not constant but monotonically decreases as FIP increases.

NASA's Genesis mission was flown to capture samples of the solar wind and return them to the Earth for measurement. The purpose of the mission was to determine the chemical and isotopic composition of the Sun with significantly better precision than known before. Abundance data are now available for noble gases, magnesium, sodium, calcium, potassium, aluminum, chromium, iron, and other elements. Here, we report abundance data for hydrogen in four solar wind regimes collected by the Genesis mission (bulk solar wind, interstream low-energy wind, coronal hole high-energy wind, and coronal mass ejections). The mission was not designed to collect hydrogen, and in order to measure it, we had to overcome a variety of technical problems, as described herein. The relative hydrogen fluences among the four regimes should be accurate to better than ±5-6%, and the absolute fluences should be accurate to ±10%. We use the data to investigate elemental fractionations due to the first ionization potential during acceleration of the solar wind. We also use our data, combined with regime data for neon and argon, to estimate the solar neon and argon abundances, elements that cannot be measured spectroscopically in the solar photosphere.

X-ray standing wave fluorescence yield depth profiling was used to determine the solar wind implanted Fe and Ni fluences in a silicon-on-sapphire (SoS) Genesis collector (60326). An internal reference standardization method was developed based on fluorescence from Si and Al in the collector materials. Measured Fe fluence agreed well with that measured previously by us on a sapphire collector (50722) as well as SIMS results by Jurewicz et al. Measured Ni fluence was higher than expected by a factor of two; neither instrumental errors nor solar wind fractionation effects are considered significant perturbations to this value. Impurity Ni within the epitaxial Si layer, if present, could explain the high Ni fluences and therefore needs further investigation. As they stand, these results are consistent with minor temporally-variable Fe and Ni fractionation on the timescale of a year.

The distribution of solar-wind ions in Genesis mission collectors, as determined by depth profiling analysis, constrains the physics of ion-solid interactions involving the solar wind. Thus, they provide an experimental basis for revealing ancient solar activities represented by solar-wind implants in natural samples. We measured the first depth profile of ^4He in a Genesis collector; the shallow implantation (peaking at

Ion microprobe elemental and isotopic determinations can be precise but difficult to quantify. Error is introduced when the reference material and the sample to be analysed have different compositions. Mitigation of such “matrix effects” is possible using ion implants. If a compositionally homogeneous reference material is available which is “matrix-appropriate,” i.e., close in major element composition to the sample to be analysed, but having an unknown concentration of the element, E, to be determined, ion implantation can be used to introduce a known amount of an E isotope, calibrating the E concentration and producing a matrix-appropriate calibrator. Nominal implant fluences (ions cm^(−2)) are inaccurate by amounts up to approximately 30%. However, ion implantation gives uniform fluences over large areas, thus it is possible to “co-implant” an additional reference material of any bulk composition having known amounts of E, independently calibrating the implant fluence. Isotope-ratio measurement standards can be produced by implanting two different isotopes, but permil level precision requires post-implant calibration of the implant isotopic ratio. Examples discussed include: (1) standardising Li in melilite; (2) calibrating a ^(25)Mg implant fluence using NIST SRM 617 glass; and (3) using Si co-implanted with ^(25)Mg alongside NIST SRM 617 to produce a calibrated measurement of Mg in Si.