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257 results on '"Kaczer, Ben"'

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1. Physics-Based and Closed-Form Model for Cryo-CMOS Subthreshold Swing

2. Comphy v3.0 -- A Compact-Physics Framework for Modeling Charge Trapping Related Reliability Phenomena in MOS Devices

7. Evidence of contact-induced variability in industrially-fabricated highly-scaled MoS2 FETs.

11. NBTI in Nanoscale MOSFETs - The Ultimate Modeling Benchmark

14. Compact Physics Hot-Carrier Degradation Model Valid over a Wide Bias Range

15. Manufacturing Solutions

16. Impact of Nitridation on Bias Temperature Instability and Hard Breakdown Characteristics of SiON MOSFETs

23. A Pragmatic Model to Predict Future Device Aging

26. Modeling Self-Heating Effects in Nanoscale Devices

28. Summary of Tutorials

32. On Superior Hot Carrier Robustness of Dynamically-Doped Field-Effect-Transistors

33. Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs

36. Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors

39. Deep Understanding of Electron Beam Effects on 2D Layered Semiconducting Devices Under Bias Applications

42. Scaling of double-gated WS2 FETs to sub-5nm physical gate length fabricated in a 300mm FAB

46. Understanding the Origin of Metal Gate Work Function Shift and Its Impact on Erase Performance in 3D NAND Flash Memories

47. Toward reliability-aware physics-based FET compact models

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