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Your search keyword '"Mehedi, Mehzabeen"' showing total 11 results

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11 results on '"Mehedi, Mehzabeen"'

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1. Characterisation and modelling of Random Telegraph Noise in nanometre devices

4. An Integral Methodology for Predicting Long-Term RTN

7. Defect loss and its physical processes

9. Trigger-when-charged: a technique for directly measuring RTN and BTI-induced threshold voltage fluctuation under use-Vdd

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