92 results on '"Rosenbaum, Elyse"'
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2. Model-Augmented Estimation of Conditional Mutual Information for Feature Selection
3. Signal and Power Integrity Design and Analysis for Bunch-of-Wires (BoW) Interface for Chiplet Integration on Advanced Packaging
4. Thermal-Aware SoC Macro Placement and Multi-chip Module Design Optimization with Bayesian Optimization
5. Collector Engineering of ESD PNP in BCD Technologies
6. Optimization of SCR for High-Speed Digital and RF Applications in 45-nm SOI CMOS Technology
7. Semantic Autoencoder for Modeling BEOL and MOL Dielectric Lifetime Distributions
8. Compact Models for Simulation of On-Chip ESD Protection Networks
9. Compact Models for Simulation of On-Chip ESD Protection Networks
10. A Methodology to Optimize the Number and Placement of Decoupling Capacitors in a Multilevel Power Delivery Network
11. Compact distributed multi-finger MOSFET model for circuit-level ESD simulation
12. Neural Ordinary Differential Equation Models of Circuits: Capabilities and Pitfalls
13. A High Voltage Tolerant Supply Clamp for ESD Protection in a 45-nm SOI Technology
14. Data-Driven Compact Modeling of Bipolar Junction Transistors with Recurrent Neural Networks.
15. Neural Networks for Transient Modeling of Circuits : Invited Paper
16. Considerations in High Voltage Lateral ESD PNP Design
17. Compact Model of ESD Diode Suitable for Subnanosecond Switching Transients
18. Statistical Learning of IC Models for System-Level ESD Simulation
19. Analysis and Design of Integrated Voltage Regulators for Supply Noise Rejection During System-Level ESD
20. Analysis of System-Level ESD-Induced Soft Failures in a CMOS Microcontroller
21. Numerical Methods for Event-Detection State Vector Simulation of Switched-Mode Power Supplies
22. An Interpretable Predictive Model for Early Detection of Hardware Failure
23. Sub-nanosecond Reverse Recovery Measurement for ESD Devices
24. Special Issue on Reliability
25. Decomposition Method for Event-Detection State Vector Simulation of Switched-Mode Power Supplies
26. Data-driven Reliability for Datacenter Hard Disk Drives
27. Measurement and Simulation of On-Chip Supply Noise Induced by System-Level ESD
28. Guilty As Charged: Computational Reliability Threats Posed By Electrostatic Discharge-induced Soft Errors
29. Discrete-Time Large-Signal Modeling and Numerical Methods for Flyback Converters
30. Enhanced IC Modeling Methodology for System-level ESD Simulation
31. Latch-up Model of Non-collinear PNPN Structures
32. Hardware and Software Combined Detection of SystemLevel ESD-Induced Soft Failures
33. Stochastic modeling of air electrostatic discharge parameters
34. Chip-Level ESD-induced noise on internally and externally regulated power supplies
35. On-Chip monitors of supply noise generated by system-level ESD
36. ESD Self-Protection of High-Speed Transceivers Using Adaptive Active Bias Conditioning
37. Soft-Failures Induced by System-Level ESD
38. CDM-Reliable T-Coil Techniques for a 25-Gb/s Wireline Receiver Front-End
39. Application level investigation of system-level ESD-induced soft failures
40. 2014 Best Paper and Best Student Paper Award
41. Case study of DPI robustness of a MOS-SCR structure for automotive applications
42. Full-Component Modeling and Simulation of Charged Device Model ESD
43. A Study of BER-Optimal ADC-Based Receiver for Serial Links
44. Improving the long pulse width failure current of NPN in BiCMOS technology
45. Experimental study of supply voltage stability during ESD
46. Physical Basis for CMOS SCR Compact Models
47. Tutorial I: Influence of IC packaging technology on ESD robustness of components
48. Charged Device Model Reliability of Three-Dimensional Integrated Circuits
49. Piecewise-Linear Model With Transient Relaxation for Circuit-Level ESD Simulation
50. CDM-reliable T-coil techniques for high-speed wireline receivers
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