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This paper presents a gate driver for a GaN-based half-bridge structure operating in a buck converter with input voltage >40 V or a boost converter with output voltage >30 V. Two 500 pF on-chip capacitors are utilized to construct three-level gate drivers, providing a near- $V_{{\text {DD}}}$ negative voltage for gate of the rectifier switch to eliminate the induced pulse on the gate from the high dv / dt slew rate of $V_{\text {X}}$ when the main switch is turned on. The dead time controller tunes the delay of the gate signal of the rectifier switch by sensing the slope of $V_{\text {X}}$ , thus the near-optimal zero-voltage switching can be achieved with deviation < 3 ns. The GaN driver is implemented with a 0.18- $\mu \text{m}$ BCD process. The efficiencies can be improved by 8.33% and 6.87% at light load in a buck and a boost converter due to the dead-time control. The peak efficiencies of 20 V–12 V and 12 V–18 V conversions are 86.37% and 84.39%, respectively. [ABSTRACT FROM AUTHOR]