1. Addressing planar solid oxide cell degradation mechanisms: A critical review of selected components
- Author
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Stephen J. McPhail, Stefano Frangini, Jérôme Laurencin, Elisa Effori, Amira Abaza, Aiswarya Krishnakumar Padinjarethil, Anke Hagen, Aline Léon, Annabelle Brisse, Daria Vladikova, Blagoy Burdin, Fiammetta Rita Bianchi, Barbara Bosio, Paolo Piccardo, Roberto Spotorno, Hiroyuki Uchida, Pierpaolo Polverino, Ennio Andrea Adinolfi, Fabio Postiglione, Jong‐Ho Lee, Hamza Moussaoui, and Jan Van herle
- Subjects
degradation ,electrode processes ,interconnect degradation ,lumped modelling ,multi‐scale modelling ,review ,Industrial electrochemistry ,TP250-261 ,Chemistry ,QD1-999 - Abstract
Abstract In this review paper, a critical assessment of the main degradation processes in three key components of solid oxide fuel cells and electrolysers (negative and positive electrodes and the interconnect) is undertaken, attempting prioritization of respective degradation effects and recommendation of the best approaches in their experimental ascertainment and numerical modeling. Besides different approaches to quantifying the degradation rate of an operating solid oxide cell (SOC), the latest advancements in microstructural representation (3D imaging and reconstruction) of SOC electrodes are reviewed, applied to the quantification of triple‐phase boundary (TPB) lengths and morphology evolution over time. The intrinsic degradation processes in the negative (fuel) electrode and the positive (oxygen) electrode are discussed, covering first the composition and governing mechanisms of the respective electrodes, followed by a comprehensive evaluation of the most important factors of degradation during operation. By this systematic identification of dominant degradation processes, measurement techniques, and modeling approaches, the foundations are laid for the definition of meaningful accelerated stress testing of SOC cells and stacks, which will help the technology achieve the constantly more demanding durability targets in market applications.
- Published
- 2022
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