7 results on '"Baeg, Sanghyeon"'
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2. DDR4 Ball Grid Array package intermittent fracture effect on signal integrity
3. Temperature Estimation of HBM2 Channels with Tail Distribution of Retention Errors in FPGA-HBM2 Platform
4. Quantification of Substrate Current Caused by an Individual Trap at Different Locations and Energies, Prevailing on Si/SiO₂ Interface or Si Substrate of n-MOSFETs
5. Estimation of the Trap Energy Characteristics of Row Hammer-Affected Cells in Gamma-Irradiated DDR4 DRAM
6. Divulge of Root Cause Failure in Individual Cells of 2x nm Technology DDR4 DRAM at Operating Temperature
7. Characterization of Si Charged Particles Detector by Measurement and Analysis of its Dark Current
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