Author: "Daniel Swetz" / Publication Year Range: Last 3 years - Searchworks@Jio Institute Digital Library Search Results

Your search keyword '"Daniel Swetz"' showing total 3 results

Start Over Author "Daniel Swetz" Publication Year Range Last 3 years

Author: Luca Origo, Bradley Alpert, Marco Balata, Daniel Becker, Douglas Bennett, Adriano Bevilacqua, Matteo Borghesi, Noemi Cerboni, Giancarlo Ceruti, Edvige Celasco, Matteo De Gerone, Rugard Dressler, Marco Faverzani, Elena Ferri, Joseph Fowler, Giovanni Gallucci, John Gard, Flavio Gatti, Andrea Giachero, Gene Hilton, Ulli Köster, Danilo Labranca, Maurizio Lusignoli, John Mates, Emilio Maugeri, Roberto Moretti, Stefano Nisi, Angelo Nucciotti, Luigi Parodi, Gianluigi Pessina, Stefano Ragazzi, Carl Reintsema, Dan Schmidt, Dorothea Schumann, Fabio Siccardi, Daniel Swetz, Joel Ullom, and Leila Vale
Published: 2023
Full Text: View/download PDF

Author: Elena Ferri, Bradley Alpert, Marco Balata, Daniel Becker, Douglas Bennett, Matteo Borghesi, Noemi Cerboni, Matteo De Gerone, Rugard Dressler, Marco Faverzani, Mariia Fedkevych, Joseph Fowler, Giovanni Gallucci, John Gard, Flavio Gatti, Andrea Giachero, Gene Hilton, Ulli Köster, Danilo Labranca, Maurizio Lusignoli, John Mates, Emilio Maugeri, Stefano Nisi, Angelo Nucciotti, Luca Origo, Gianluigi Pessina, Stefano Ragazzi, Carl Reintsema, Dan Schmidt, Dorothea Schumann, Daniel Swetz, Joel Ullom, and Leila Vale
Published: 2022
Full Text: View/download PDF

Author: Zachary Levine, Bradley Alpert, Amber Dagel, Joseph Fowler, Edward Jiminez, Nathan Nakamura, Daniel Swetz, Paul Szypryt, Kyle Thompson, and Joel Ullom
Abstract: We show three-dimensional reconstructions of a region of an integrated circuit from a 130 nm copper process. The reconstructions employ x-ray computed tomography, measured with a new and innovative high-magnification x-ray microscope. The instrument uses a focused electron beam to generate x rays in a 100 nm spot and energy-resolving x-ray detectors that minimize backgrounds and hold promise for identification of materials within the sample. The x-ray generation target, a layer of platinum, is fabricated on the circuit wafer itself. A region of interest is imaged from a limited range of angles and without physically removing the region from the larger circuit. The reconstruction is consistent with the circuit’s design file.
Published: 2022
Full Text: View/download PDF

Books, media, physical & digital resources

Searchworks