Descriptor: "EEPROM" / Publication Year Range: Last 3 years - Searchworks@Jio Institute Digital Library Search Results

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Start Over Descriptor "EEPROM" Publication Year Range Last 3 years

Author: Sandhya, Goundla, Sharma, Dheeraj Kumar, Angrisani, Leopoldo, Series Editor, Arteaga, Marco, Series Editor, Panigrahi, Bijaya Ketan, Series Editor, Chakraborty, Samarjit, Series Editor, Chen, Jiming, Series Editor, Chen, Shanben, Series Editor, Chen, Tan Kay, Series Editor, Dillmann, Rüdiger, Series Editor, Duan, Haibin, Series Editor, Ferrari, Gianluigi, Series Editor, Ferre, Manuel, Series Editor, Hirche, Sandra, Series Editor, Jabbari, Faryar, Series Editor, Jia, Limin, Series Editor, Kacprzyk, Janusz, Series Editor, Khamis, Alaa, Series Editor, Kroeger, Torsten, Series Editor, Li, Yong, Series Editor, Liang, Qilian, Series Editor, Martín, Ferran, Series Editor, Ming, Tan Cher, Series Editor, Minker, Wolfgang, Series Editor, Misra, Pradeep, Series Editor, Möller, Sebastian, Series Editor, Mukhopadhyay, Subhas, Series Editor, Ning, Cun-Zheng, Series Editor, Nishida, Toyoaki, Series Editor, Oneto, Luca, Series Editor, Pascucci, Federica, Series Editor, Qin, Yong, Series Editor, Seng, Gan Woon, Series Editor, Speidel, Joachim, Series Editor, Veiga, Germano, Series Editor, Wu, Haitao, Series Editor, Zamboni, Walter, Series Editor, Zhang, Junjie James, Series Editor, Mishra, Brijesh, editor, and Tiwari, Manish, editor
Published: 2023
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Author: 洪国华, 卓启越, 葛　优, and 邹望辉
Abstract: Copyright of Electronic Components & Materials is the property of Electronic Components & Materials and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Published: 2023
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Author: Venugopal Parasuraman, Vijay Adhithyan and Venugopal Parasuraman, Vijay Adhithyan
Abstract: The backbone of this dissertation is a discussion of the adaptability of optical fiber modes of transmission. The technological boom in commercial vehicles tends to include more electronic components and more data flow. The traditional copper transmission is reliable but has drawbacks. At present optical fiber, technology is in huge demand in fields like avionics, medicine, and communication across continents. The drastic shift to fiber was due to the enormous increase in capacity. Simultaneously the commercial vehicle sector is advancing in the direction of sensors that require a non-disruptive data flow. Furthermore, autonomous driving technology pushes the transition from copper to optic fiber. One expects optical fiber to supplant the traditional copper cables in the future. The dispersion and scattering losses need to be studied as well as the difference in cost.
Published: 2022

Author: Šumanovac, Leon and Aleksi, Ivan
Subjects: look-up table, battery's state of charge, postotak napunjenosti baterije, look-up tablica, Arduino, TECHNICAL SCIENCES. Computing. Architecture of Computer Systems, TEHNIČKE ZNANOSTI. Računarstvo. Arhitektura računalnih sustava, EEPROM
Abstract: U ovom završnom radu su prikazana 2 jednostavna načina očitavanja stanja napunjenosti baterije, a to su metoda aproksimacije po naponu i metoda pomoću EEPROM-ove look-up tablice. Metode su međusobno uspoređene kako bi se odredila preciznost i točnost. This final paper presents 2 simple ways of reading battery's state of charge, and those are voltage approximation method and method using EEPROM's look-up table. Methods are compared to each other to determine precision and accuracy.
Published: 2022

Author: Matteo, Franck, Coulié, Karine, Simola, Roberto, Postel-Pellerin, Jérémy, Melul, Franck, and Regnier, Arnaud
Subjects: *COMPUTER art, *LEGAL literature, *COMPUTER storage devices, *COMPUTER engineering, *RAILROAD tunnels
Abstract: Electrically Erasable Programmable Read Only Memory (EEPROM) is a widely used memory device, nowadays implemented in submicron technology nodes. In this paper we show how the well-known trapping power law found in the literature can be retrieved by combining well calibrated state of the art Technology Computer Aided-Design (TCAD) simulations with a compact model for tunnel oxide degradation during EEPROM cycling. We pinpoint how this approach can be used to predictively assess the programming window closure and consequently, considerably reduce the time-consuming cycling test procedure. Finally, we show how this methodology can cover a wide range of temperatures, making it very attractive for high demanding applications such as automotive. • TCAD simulation of a state of the art 110 nm technology node EEPROM cell. • Predictive simulation of the programming window closure. • Can be extended in a temperature range typical of automotive applications. • This approach is transposable to NAND Flash-EEPROM and possibly to NOR Flash-EEPROM. [ABSTRACT FROM AUTHOR]
Published: 2022
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