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39 results on '"Kaczer, Ben"'

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1. Physics-Based and Closed-Form Model for Cryo-CMOS Subthreshold Swing

2. Comphy v3.0 -- A Compact-Physics Framework for Modeling Charge Trapping Related Reliability Phenomena in MOS Devices

7. Evidence of contact-induced variability in industrially-fabricated highly-scaled MoS2 FETs.

10. Compact Physics Hot-Carrier Degradation Model Valid over a Wide Bias Range

11. Impact of Nitridation on Bias Temperature Instability and Hard Breakdown Characteristics of SiON MOSFETs

16. A Pragmatic Model to Predict Future Device Aging

19. Summary of Tutorials

22. On Superior Hot Carrier Robustness of Dynamically-Doped Field-Effect-Transistors

23. Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs

26. Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors

29. Deep Understanding of Electron Beam Effects on 2D Layered Semiconducting Devices Under Bias Applications

32. Scaling of double-gated WS2 FETs to sub-5nm physical gate length fabricated in a 300mm FAB

36. Understanding the Origin of Metal Gate Work Function Shift and Its Impact on Erase Performance in 3D NAND Flash Memories

37. Toward reliability-aware physics-based FET compact models

38. LaSiO x - and Al 2 O 3 -Inserted Low-Temperature Gate-Stacks for Improved BTI Reliability in 3-D Sequential Integration.

39. Cyclic Thermal Effects on Devices of Two‐Dimensional Layered Semiconducting Materials.

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