Search

Your search keyword '"Liu, Sanwei"' showing total 24 results
Start Over Author "Liu, Sanwei" Publication Year Range Last 3 years
24 results on '"Liu, Sanwei"'

2. Simulation on Initial Development of Surface Streamer in SF6 Gas Environment

Author

Qu, Zhe, Zhong, Lipeng, Kang, Ning, Chen, Zhen, Dong, Hongyu, Ta, Yierjiang, Duan, Xiaoli, Liu, Sanwei, Angrisani, Leopoldo, Series Editor, Arteaga, Marco, Series Editor, Panigrahi, Bijaya Ketan, Series Editor, Chakraborty, Samarjit, Series Editor, Chen, Jiming, Series Editor, Chen, Shanben, Series Editor, Chen, Tan Kay, Series Editor, Dillmann, Rüdiger, Series Editor, Duan, Haibin, Series Editor, Ferrari, Gianluigi, Series Editor, Ferre, Manuel, Series Editor, Hirche, Sandra, Series Editor, Jabbari, Faryar, Series Editor, Jia, Limin, Series Editor, Kacprzyk, Janusz, Series Editor, Khamis, Alaa, Series Editor, Kroeger, Torsten, Series Editor, Li, Yong, Series Editor, Liang, Qilian, Series Editor, Martín, Ferran, Series Editor, Ming, Tan Cher, Series Editor, Minker, Wolfgang, Series Editor, Misra, Pradeep, Series Editor, Möller, Sebastian, Series Editor, Mukhopadhyay, Subhas, Series Editor, Ning, Cun-Zheng, Series Editor, Nishida, Toyoaki, Series Editor, Oneto, Luca, Series Editor, Pascucci, Federica, Series Editor, Qin, Yong, Series Editor, Seng, Gan Woon, Series Editor, Speidel, Joachim, Series Editor, Veiga, Germano, Series Editor, Wu, Haitao, Series Editor, Zamboni, Walter, Series Editor, Zhang, Junjie James, Series Editor, Yang, Qingxin, editor, Li, Jian, editor, Xie, Kaigui, editor, and Hu, Jianlin, editor

Published
2023
Full Text
View/download PDF

5. Arc Ablation on Metal Contact in Insulating Oil: Microscopic Mechanism and Influencing Factor

Author

Liang, Kaibin, Wang, Feng, Zhong, Lipeng, Chen, She, Sun, Qiuqin, Duan, Xinyu, and Liu, Sanwei

Abstract

Transient arc ablation caused by load current during switching is the primary cause of internal contact damage in the on-load tap changers (OLTCs). However, the mechanism of arc ablation on contact in an oil gap, a basis for effective failure assessment, is rarely involved by far. Herein, the arc ablation mechanism was experimentally investigated based on breakdown performance, transient pulse current, and changes to microscopic surface morphology. Silver cathode caused an apparent reduction in the average breakdown voltage, whose data reliability was verified by the Weibull distribution compared to the copper cathode. With the increased applied voltage, the discharge duration decreases, while the discharge pulse’s steepness increases significantly. The materials’ properties of the cathode, including electrical conductivity, melting point, and stability of metal oxides, have a critical impact on arc ablation. As a result, the comparison of the surface morphology in the scanning electron microscopy (SEM) image of the two cathodes shows that the silver electrode has better surface discharge uniformity and remains relatively smooth after arc ablation, whereas the copper oxides produced by arc ablation are relatively stable and irregularly attached to the electrode surface, forming pits and bumps. The transfer process materials during the arc process are also discussed, leading to variations in the quality of contact materials and metal contamination of insulating oil. The results in this article contribute to a better understanding of the damage mechanism of arc ablation on contact and its influencing factors.

Published
2024
Full Text
View/download PDF

20. Research on latent defect detection technology of high voltage cable

Author

Duan Jianjia, Xie Yi, Huang Fuyong, Liu Sanwei, Chao Qiu, Zeyu Zeng, and Duan Xiaoli

Subjects
History, Materials science, business.industry, Electrical engineering, High-voltage cable, business, Computer Science Applications, Education
Abstract

As a component of the Internet of things, high-voltage cables are the power supply infrastructure for the modern development of cities. The operation experience shows that the high-voltage cable has been broken down many times, due to the defective operation. At present, due to the limitation of detection technology, the research on detection and identification of defects in high-voltage cables is progressing slowly. Therefore, a new DR technology based on X-ray digital imaging is proposed in this paper to realize real-time detection of defects in the semi-conductive buffer layer of high-voltage cables, and intelligent detection of DR images of high-voltage cables by using image depth processing technology to realize intelligent identification of defects in the buffer layer of power cables. The results show that using the new DR technique proposed in this paper, the accurate and intuitive DR image of high-voltage cable can be obtained quickly, and the intelligent identification of defects can be realized.

Published
2021

Catalog

Books, media, physical & digital resources
See catalog results