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Abstract A fundamental parameter-based quantification scheme for confocal XRF was applied to sub-micron synchrotron radiation X-ray fluorescence (SR-XRF) data obtained at the beamline P06 of the Deutsches Elektronen-Synchrotron (DESY, Hamburg, Germany) from two sections C0033-01 and C0033-04 that were wet cut from rock fragment C0033 collected from Cb-type asteroid (162173) Ryugu by JAXA’s Hayabusa2 mission. Trace-element quantifications show that C0033 bulk matrix is CI-like, whereas individual mineral grains (i.e., magnetite, pyrrhotite, dolomite, apatite and breunnerite) show, depending on the respective phase, minor to strong deviations. The non-destructive nature of SR-XRF coupled with a new PyMca (a Python toolkit for XRF data analysis)-based quantification approach, performed in parallel with the synchrotron experiments, proves to be an attractive tool for the initial analysis of samples from return missions, such as Hayabusa2 and OSIRIS-REx, the latter returning material from a B-type asteroid (101955) Bennu in 2023. Graphical Abstract

On 14 December 2013 (UTC), China's Chang'E-3 (CE-3) succeeded in landing on the Moon's surface. The CE-3 landing site is in northern Mare Imbrium and several tens of meters away from the rim of a young crater with a few hundred meters in diameter. In-situ measurements of lunar soil around the roving area were conducted from Active Particle-induced X-ray Spectrometer (APXS) onboard Yutu rover. Three relatively young lunar soil samples in the CE-3 landing site were investigated. Previous studies suggested that these samples are a new type of basalt, not discovered yet in previous missions before the CE-3 in-situ measurements. It plays an essential role in promoting the understanding of lunar volcanic history. However, their results are deviated, and thus scrutinizing the data as per our optimized model to derive a more precise result is of necessity. In this paper, we present an optimized model for data analysis based on APXS measurements to derive the major elements concentrations. The optimized model has the advantages of reliability and being independent of calibration by ground standards. The particle size effect is applied in lunar X-ray fluorescence modeling for correction, improving the accuracy in determining the elemental concentrations for the actual measurement. Our results are distinct in the correlation plots by carrying out a comparison with previous lunar regolith samples from Apollo, Luna, and Chang'E-5 missions, indicating that the CE-3 landing site is a new region apart from previous in-situ or laboratory detection prior to the CE-3 measurements. It suggests a kind of young mare basalt with unusual petrological characteristics compared with previous samples and similar geochemical properties of CE-3 landing site and western Procellarum and Imbrium (WPI), with a signature of western Procellarum. [ABSTRACT FROM AUTHOR]

A fundamental parameter-based quantification scheme for confocal XRF was applied to sub-micron synchrotron radiation X-ray fluorescence (SR-XRF) data obtained at the beamline P06 of the Deutsches Elektronen-Synchrotron (DESY, Hamburg, Germany) from two sections C0033-01 and C0033-04 that were wet cut from rock fragment C0033 collected from Cb-type asteroid (162173) Ryugu by JAXA's Hayabusa2 mission. Trace-element quantifications show that C0033 bulk matrix is CI-like, whereas individual mineral grains (i.e., magnetite, pyrrhotite, dolomite, apatite and breunnerite) show, depending on the respective phase, minor to strong deviations. The non-destructive nature of SR-XRF coupled with a new PyMca (a Python toolkit for XRF data analysis)-based quantification approach, performed in parallel with the synchrotron experiments, proves to be an attractive tool for the initial analysis of samples from return missions, such as Hayabusa2 and OSIRIS-REx, the latter returning material from a B-type asteroid (101955) Bennu in 2023. [ABSTRACT FROM AUTHOR]

This review presents the features of the application of X-ray fluorescence analysis to the study of a chemical composition and thickness of films and surface coatings. Examples of X-ray fluorescence analysis of coating surfaces of simple and complex configurations are presented. The variants of considering the matrix effects and coating thickness for various materials are discussed. The possibilities of methodological techniques using scattered primary X-ray radiation or fluorescence radiation from a substrate on which a film is applied to determine its attenuating characteristics are discussed. The features determination of the chemical composition and coatings thickness and thin films when using the XRF version with total external reflection (TXRF) spectrometers are considered. The examples of performance of conventional XRF analysis are given. The results of a round‐robin test with application of X‐ray fluorescence thickness determination of multilayered samples (Au/Ni/Cu) on a chromium coated quartz glass substrate were presented and discussed. • The review of the application of XRF to the study of films and coatings is presented. • Specific requirements in the study of films and coating-substrate are considered. • Using of the intensity ratio of X-ray lines to research of multilayer are discussed. [ABSTRACT FROM AUTHOR]