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The composition and thickness of wide band multilayer optical filters, especially designed for the Fluorescence Detector of the Pierre Auger Project, were measured using the RBS (Rutherford Backscattering Spectroscopy) method. The filters were made of 6 pair thin film layers of ZrO[sub 2]/SiO[sub 2], deposited on UV glass or absorption filters. The depth profile of the ZrO[sub 2] layers have been measured directly, while reliable results for the SiO[sub 2] layers could also be extracted. Relative thickness and density of the individual layers have been deduced for the samples, as prepared by electron beam deposition technique as well as after thermal annealing. [ABSTRACT FROM AUTHOR]

Energy spectra of α-particles channeling along the optical axis (c-axis) of a quartz crystal in the energy region E[sub α]=3.0-3.5 MeV in the backscattering geometry were taken and analyzed. Computer simulations based on the assumption that the dechanneling of α-particles follows an exponential law are in good agreement with the measured spectra, yielding electronic stopping powers for the specific crystal orientation that vary between 17.82 and 16.12 eV/Å respectively for the energy interval into consideration. [ABSTRACT FROM AUTHOR]