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Your search keyword '"Sun, Pengju"' showing total 4 results
4 results on '"Sun, Pengju"'

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1. Online Gate-Oxide Degradation Monitoring of Planar SiC MOSFETs Based on Gate Charge Time.

2. Online Condition Monitoring for Both IGBT Module and DC-Link Capacitor of Power Converter Based on Short-Circuit Current Simultaneously.

3. Monitoring Bond Wires Fatigue of Multichip IGBT Module Using Time Duration of the Gate Charge.

4. Monitoring Potential Defects in an IGBT Module Based on Dynamic Changes of the Gate Current.

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