1. Intelligent Classification of Metallographic Based on Improved Deep Residual Efficiency Networks.
- Author
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Huang, Xiaohong, Liu, Yanping, Qi, Xueqian, and Song, Yue
- Subjects
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ARTIFICIAL neural networks , *ARTIFICIAL intelligence , *COMPUTER vision , *CONVOLUTIONAL neural networks , *IMAGE recognition (Computer vision) , *COMPUTER performance - Abstract
The recognition of steel microstructure images plays a crucial role in the metallographic analysis process. Although some progress has been made through the application of artificial intelligence algorithms, several challenges remain. First, existing algorithms exhibit weak nonlinear feature extraction capabilities and noticeable limitations. Second, they overlook the intrinsic noise and redundant interference present in microscopic images. To address these issues, this paper investigates the automatic recognition of metallographic tissues by leveraging residual structures in deep neural networks. An enhanced residual network model based on transfer learning is proposed, which utilizes the pre-trained weights from the ImageNet dataset to facilitate learning with small sample data. This network offers higher classification accuracy and higher F1 scores. In addition, a deep residual shrinkage network model based on an attention mechanism is proposed. This model incorporates an attention sub-network into the original residual module and employs a soft threshold function to eliminate redundant features, including noise. The proposed algorithms are evaluated against various convolutional neural networks using 20 types of metallographic test sets. The experimental results showed that both methods have high accuracy rates of 95% and 94.44%, respectively, and F1 scores of 0.9464 and 0.9419. While maintaining the complexity of the model, there has been a significant improvement in accuracy, and the models exhibit strong generalization capabilities. Our research contributes to enhancing production efficiency, strengthening quality control, and improving material performance through computer vision technology. [ABSTRACT FROM AUTHOR]
- Published
- 2024
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