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529 results on '"Kaczer, Ben"'

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1. Physics-Based and Closed-Form Model for Cryo-CMOS Subthreshold Swing

2. Comphy v3.0 -- A Compact-Physics Framework for Modeling Charge Trapping Related Reliability Phenomena in MOS Devices

7. Evidence of contact-induced variability in industrially-fabricated highly-scaled MoS2 FETs.

11. NBTI in Nanoscale MOSFETs - The Ultimate Modeling Benchmark

14. Compact Physics Hot-Carrier Degradation Model Valid over a Wide Bias Range

15. Manufacturing Solutions

16. Impact of Nitridation on Bias Temperature Instability and Hard Breakdown Characteristics of SiON MOSFETs

20. Channel Hot Carriers and Other Reliability Mechanisms

21. Conclusions and Perspectives

22. Negative Bias Temperature Instability in Nanoscale Devices

23. Techniques and Devices

24. Negative Bias Temperature Instability in (Si)Ge pMOSFETs

25. Degradation Mechanisms

26. Introduction

30. A Pragmatic Model to Predict Future Device Aging

34. Modeling Self-Heating Effects in Nanoscale Devices

36. Summary of Tutorials

41. On Superior Hot Carrier Robustness of Dynamically-Doped Field-Effect-Transistors

42. Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs

45. Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors

48. Deep Understanding of Electron Beam Effects on 2D Layered Semiconducting Devices Under Bias Applications

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