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101 results on '"Pae, S."'

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10. A Comprehensive Reliability Characterization of 5G SoC Mobile Platform Featuring 7nm EUV Process Technology

11. Reliability of Industrial grade Embedded-STT-MRAM

13. 1Gbit High Density Embedded STT-MRAM in 28nm FDSOI Technology

14. Reliability of 8Mbit Embedded-STT-MRAM in 28nm FDSOI Technology

18. Considering physical mechanisms and geometry dependencies in 14nm FinFET circuit aging and product validations

21. Voluntary disclosure of precision information

23. Optimal disclosure policy in oligopoly markets

24. Discretionary disclosure, efficiency, and signal informativeness

25. High performance 32nm logic technology featuring 2nd generation high-k + metal gate transistors

28. Strategic interaction in auditing: An analysis of auditors' legal liability, internal control system quality, and audit effort

29. A 32nm logic technology featuring 2nd-generation high-k + metal-gate transistors, enhanced channel strain and 0.171μm2 SRAM cell size in a 291Mb array

30. Dielectric breakdown in a 45 nm high-k/metal gate process technology

31. BTI reliability of 45 nm high-K + metal-gate process technology

33. Information sharing in the presence of preemptive incentives: Economic consequences of mandatory disclosure

34. A 45nm Logic Technology with High-k+Metal Gate Transistors, Strained Silicon, 9 Cu Interconnect Layers, 193nm Dry Patterning, and 100% Pb-free Packaging

40. An analysis of the economic consequences of the proportionate liability rule

41. Therapeutic communication techniques used by experienced and inexperienced care workers toward the elderly in a nursing home

48. Similarities and variation in noun and verb acquisition: a crosslinguistic study of children learning German, Korean, and Turkish.

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