130 results on '"Tokas, R.B."'
Search Results
2. Thermally tunable terahertz omnidirectional photonic bandgap and defect mode in 1D photonic crystals containing moderately doped semiconductor
3. Indentation modulus and microstructural properties of Zirconia – Alumina – Magnesia composite thin films deposited by electron beam evaporation under varying oxygen pressure
4. Tunable mirrors and filters in 1D photonic crystals containing polymers
5. Influence of oxygen partial pressure on microstructure, optical properties, residual stress and laser induced damage threshold of amorphous HfO2 thin films
6. Synthesis of binary and multinary metal sulphides by precipitation and their characterisation
7. Deposition and in-situ characterization of Ti–Zr–V alloy thin films annealed at different temperatures under ultra-high vacuum conditions
8. Effect of O2/Ar gas flow ratio on the optical properties and mechanical stress of sputtered HfO2 thin films
9. A probe into compositional and structural dependence of optical properties of lanthanum fluoride films prepared by resistive heating
10. EXAFS study on yttrium oxide thin films deposited by RF plasma enhanced MOCVD under the influence of varying RF self-bias
11. Remarkably high capacity Li ion batteries with rf sputter deposited TiO2 thin film anodes on SS substrates
12. Investigation on the adsorption characteristics of sodium benzoate and taurine on gold nanoparticle film by ATR–FTIR spectroscopy
13. Investigation of elastic and optical properties of electron beam evaporated ZrO2–MgO composite thin films
14. Influence of surface relief depth on diffraction efficiency of phase gratings recorded in Slavich PFG-01
15. Transfer matrix based reverse engineering approach to analyse annealing induced changes in optical transmission of TiO2/Ag/TiO2/Ag multilayer
16. Determination of the optical constants of HfO 2–SiO 2 composite thin films through reverse fitting of transmission spectra
17. Effects of oxygen flow rate on microstructure and optical properties of aluminum oxide films deposited by electron beam evaporation technique
18. X-ray reflectivity studies on DLC films deposited by microwave ECR CVD: Effect of substrate bias
19. Poly(3-hexylthiophene) based field-effect transistors with gate SiO 2 dielectric modified by multi-layers of 3-aminopropyltrimethoxysilane
20. Electrochemically controlled pitting corrosion in Ni film: A study of AFM and neutron reflectometry
21. A comparative morphological study of electron beam co-deposited binary optical thin films of HfO 2:SiO 2 and ZrO 2:SiO 2
22. Substrate bias effects during diamond like carbon film deposition by microwave ECR plasma CVD
23. Characterization of ion beam sputter deposited W and Si films and W/Si interfaces by grazing incidence X-ray reflectivity, atomic force microscopy and spectroscopic ellipsometry
24. RETRACTED ARTICLE: Refractive-index tailoring and morphological evolutions in Gd2O3–SiO2 and ZrO2–SiO2 composite thin films
25. Correlation of atomic force–distance microscopy and spectrophotometric techniques in the analysis of optical multilayer spectral aging process
26. Characterization of microroughness parameters in gadolinium oxide thin films: A study based on extended power spectral density analyses
27. Reactive electron beam evaporated gadolinia films at ambient substrate temperature: optical properties and morphology studies
28. Observation and analysis of self-organized surface grain structures in silica films under nonepitaxial growth mode
29. Study of aging effects on optical properties and residual stress of HfO2 thin film
30. RETRACTED: Fractals and superstructures in gadolinia thin film morphology: Influence of process variables on their characteristic parameters
31. Retraction notice to "Analysis of codeposited Gd2O3/SiO2 composite thin films by phase modulated spectroscopic ellipsometric technique" [Appl. Surf. Sci. 253 (December (4)) (2006) 1787–1795].
32. Study of ZrO2 thin films deposited at glancing angle by radio frequency magnetron sputtering under varying substrate rotation
33. Retraction notice to "Morphological, microstructural and optical properties supremacy of binarycomposite films—A study based on Gd2O3/SiO2 system" [Appl. Surf. Sci. 253, (December (7)) (2006) 3455–3463]
34. Retraction notice to “Superior refractive index tailoring properties in composite ZrO2/SiO2 thin film systems achieved through reactive electron beam codeposition process” [Appl. Surf. Sci. 253 November (2) (2006) 618–626]
35. Retraction notice to “Relative performances of effective medium formulations in interpreting specific composite thin films optical properties” [Appl. Surf. Sci. 253 June (16) (2007) 6787–6799]
36. Retraction Notice to “Optical properties and morphological changes in gadolinia films deposited under ambient substrate temperature conditions” [(Opt. Mater.) 27 (8) (May 2005) 1402–1409]
37. Effect of angle of deposition on micro-roughness parameters and optical properties of HfO2 thin films deposited by reactive electron beam evaporation
38. Omnidirectional photonic band gap in magnetron sputtered TiO2/SiO2 one dimensional photonic crystal
39. RF plasma enhanced MOCVD of yttria stabilized zirconia thin films using octanedionate precursors and their characterization
40. Study of hafnium oxide thin films deposited by RF magnetron sputtering under glancing angle deposition at varying target to substrate distance
41. Micro-structural characterization of low resistive metallic Ni germanide growth on annealing of Ni-Ge multilayer
42. Stoichiometry dependent inter diffusion and structural evolution in Al–Ni multilayer
43. SEIRA studies of uracil adsorbed on wet-chemically prepared gold nanoparticles film on glass substrate – Effect of morphology of film
44. Determination of the optical constants of HfO2–SiO2 composite thin films through reverse fitting of transmission spectra
45. RETRACTED: Relative performances of effective medium formulations in interpreting specific composite thin films optical properties
46. Poly(3-hexylthiophene) based field-effect transistors with gate SiO2 dielectric modified by multi-layers of 3-aminopropyltrimethoxysilane
47. RETRACTED: Spectral diffuse reflectance measurements of gadolinia, silica thin film systems using synchrotron radiation
48. RETRACTED: Morphological, microstructural and optical properties supremacy of binary composite films—A study based on Gd2O3/SiO2 system
49. A comparative morphological study of electron beam co-deposited binary optical thin films of HfO2:SiO2 and ZrO2:SiO2
50. RETRACTED: Analysis of codeposited Gd2O3/SiO2 composite thin films by phase modulated spectroscopic ellipsometric technique
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.