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Different laser damage testing protocols, including 1-on-1, S-on-1, and Raster Scan, were conducted on 532 nm polarizers to evaluate the damage resistance and mechanisms. A comparison of the laser-induced damage thresholds (LIDTs) revealed different damage characteristics and major contributions to film failure for different polarizations. For P polarization, the LIDTs for the three test protocols were nearly the same because of the stabilization of two typical damage morphologies of flat-bottomed pits and mussel damage pits. For S polarization, the LIDTs for multiple pulses were lowest, where absorptive defect-induced damage was revealed. The damage characteristics of 532 nm polarizers and 1064 nm polarizers have been also compared. The mussel damage pits, which are similar to the typical damage morphologies of ultraviolet (UV) laser damage to fused silica, were observed for the first time in coatings of 532 nm polarizers. This suggests that, the polishing-induced subsurface damage of fused silica substrates may tend to be excited by a short-wavelength laser rather than the fundamental wavelength. • The damage resistance and damage characteristics of 532 nm polarizers in different laser damage test protocols, including 1-on-1, S-on-1, and Raster Scan, have been summarized, as a reference for thin-film optics in high-power laser applications. • The damage characteristics of 532 nm polarizers and 1064 nm polarizers were compared. The subsurface damage of fused silica substrates is easily excited by short-wavelength lasers. • Mussel pits, associated with the ultraviolet laser damage of fused silica, were observed in the coatings for the first time. [ABSTRACT FROM AUTHOR]

Liquid crystal polarization gratings (LCPGs) possess unique optical properties and therefore are widely used in laser systems. Therefore, developing our understanding of the laser damage resistance of LCPGs is critical for future high-intensity laser applications. In this study, the LCPGs (Λ = 8 μm) were fabricated from liquid crystal polymer (LCP) films with photo-alignment technology, which had a small-angle (∼7.51°) diffraction order with high diffraction efficiency (∼92 %) under chiral polarized incidence at 1064 nm. The diffraction efficiency and polarization of each diffraction order were determined by the polarization of the incident light. The damage characteristics of the LCPGs were investigated using a chiral polarized nanosecond laser at 1064 nm in a one-on-one test. The laser-induced damage thresholds (LIDTs) of left-handed circular polarization (LHCP) and right-handed circular polarization (RHCP) were 8.0 J/cm2 and 8.5 J/cm2, respectively. For comparison, the LIDTs of S-polarization and P-polarization were 7.8 J/cm2 and 8.4 J/cm2, respectively. All the damage occurred at the interface between the LCP layer and the substrate when the laser fluence was near the LIDT, and the damage morphology was observed with a scanning electron microscope (SEM), including flat pits, cracks, and bumps at the edge of the pits. The results indicate that the LIDTs and damage morphology of the LCPGs were insensitive to the polarization of the irradiation. The electrical effects of differently polarized irradiation on the LCPGs were simulated using the finite element method (FEM). The electric field distribution was symmetrical under irradiation by LHCP and RHCP lasers. However, the distribution of the electric field under different linearly polarized irradiation conditions were distinct. Based on these findings, we believe that the contribution of chiral polarized irradiation to the damage was consistent and that the LIDTs were similar. This study has important implications for the application and development of LCPGs in high-intensity laser systems. • The laser-induced damage of liquid crystal polarization gratings (LCPGs) is first proposed. • We investigated the laser-induced damage of the LCPGs using a nanosecond pulsed laser with chiral polarized irradiation. • This study provides reference for the application and development of LCPGs in high-intensity laser systems. [ABSTRACT FROM AUTHOR]