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Second‐order distributed feedback (DFB) resonators are widely used for thin‐film lasers as they combine low lasing thresholds with ease of manufacturing. Here, the grating design parameters are varied to map the lasing characteristics of lead halide perovskite films deposited on a single substrate that contains hundreds of high‐quality silicon nitride surface gratings. The lowest lasing threshold (≈130 µJ cm−2) is identified through the aid of near‐field and far‐field imaging spectroscopy in a four‐dimensional design space composed of grating period, duty cycle, active layer thickness, and cavity length. Moreover, it is shown that antisymmetric modes support high‐quality lasing (Q up to ≈10800) in the second‐order DFBs. The multi‐dimensional experimental analysis is accompanied by a thorough theoretical study with a semi‐empirical model based on coupled wave equations, which is used to investigate the lasing characteristics beyond the manufacturing range. The results can be applied to a broad range of thin‐film DFB resonators, enabling the design of more complex laser stack configurations including light‐emitting devices for current‐injection lasing. [ABSTRACT FROM AUTHOR]

All-inorganic cesium lead halide perovskites possess excellent thermal stability, a feature that renders them highly favorable for optoelectronic applications with an elevated thermal budget. Employing a coevaporation approach for their deposition holds promise for manufacturing at an industrial level, owing to improvements in device scalability and reproducibility. For unlocking the full potential of vacuum-evaporated perovskite thin films, it is crucial to delve deeper into their crystallization process, which, as a solid-state reaction, has been less investigated compared to the crystallization process of, most commonly used, solution-based methods. In this work, we employ spectroscopic ellipsometry, a nondestructive, high speed, and high accuracy characterization method, to study the real time annealing effect on thermally coevaporated CsPbI 2 Br thin films in a temperature range between 25 and 300 °C. We achieve this by developing a singular dynamic model that can be fitted in real time as a function of temperature, providing insights into how thermal annealing influences the perovskite film's morphology and optical constants. Based on the latter, we derive the temperature dependence of the thermo-optic coefficient and Urbach energy as well as analyze the interband transition energies via critical point analysis. We demonstrate that the γ- to β-phase transition can be identified through a pronounced shift in the bandgap energy, whereas the β- to α-phase transition can be discerned by a sharp increase in the film's roughness. We corroborate the obtained fit results with additional in- and ex situ measurements, such as in situ grazing incidence wide-angle X-ray scattering, atomic force microscopy, reflectance/transmittance, and profilometry.