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The advent of back-illuminated complementary metal-oxide-semiconductor (CMOS) sensors and their well-known advantages over charge-coupled devices (CCDs) make them an attractive technology for future X-ray missions. However, numerous challenges remain, including improving their depletion depth and identifying effective methods to calculate per-pixel gain conversion. We have tested a commercial Sony IMX290LLR CMOS sensor under X-ray light using an $^{55}$Fe radioactive source and collected X-ray photons for $\sim$15 consecutive days under stable conditions at regulated temperatures of 21{\deg}C and 26{\deg}C. At each temperature, the data set contained enough X-ray photons to produce one spectrum per pixel consisting only of single-pixel events. We determined the gain dispersion of its 2.1 million pixels using the peak fitting and the Energy Calibration by Correlation (ECC) methods. We measured a gain dispersion of 0.4\% at both temperatures and demonstrated the advantage of the ECC method in the case of spectra with low statistics. The energy resolution at 5.9 keV after the per-pixel gain correction is improved by $\gtrsim$10 eV for single-pixel and all event spectra, with single-pixel event energy resolution reaching $123.6\pm 0.2$ eV, close to the Fano limit of silicon sensors at room temperature. Finally, our long data acquisition demonstrated the excellent stability of the detector over more than 30 days under a flux of $10^4$ photons per second., Comment: 15 pages, 7 figures, accepted for publication in JATIS

The MIT X-ray Polarimetry Beamline is a facility that we developed for testing components for possible use in X-ray polarimetry. Over the past few years, we have demonstrated that the X-ray source can generate nearly 100% polarized X-rays at various energies from 183 eV (Boron K$\alpha$) to 705 eV (Fe L$\alpha$) using a laterally graded multilayer coated mirror (LGML) oriented at 45\deg\ to the source. The position angle of the polarization can be rotated through a range of roughly 150\deg. In a downstream chamber, we can orient a Princeton Instruments MTE1300B CCD camera to observe the polarized light either directly or after reflection at 45\deg\ by a second LGML. In support of the REDSoX Polarimeter project, we have tested four other detectors by directly comparing them to the PI camera. Two were CCD cameras: a Raptor Eagle XV and a CCID94 produced by MIT Lincoln Laboratories, and two had sCMOS sensors: the Sydor Wraith with a GSENSE 400BSI sensor and a custom Sony IMX290 sensor. We will show results comparing quantum efficiencies and event images in the soft X-ray band.