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Considering the increasing demand for Li-ion batteries, there is a need for sophisticated recycling strategies with both high recovery rates and low costs. Applying optical sensors for automating component detection is a very promising approach because of the non-contact, real-time process monitoring and the potential for complete digitization of mechanical sorting processes. In this work, mm-scale particles from shredded end-of-life Li-ion batteries are investigated by five different reflectance sensors, and a range from the visible to long-wave infrared is covered to determine the ideal detection window for major component identification as relevant input signals to sorting technologies. Based on the characterization, a spectral library including Al, Cu, separator foil, inlay foil, and plastic splinters was created, and the visible to near-infrared range (400–1000 nm) was identified as the most suitable spectral range to reliably discriminate between Al, Cu, and other battery components in the recycling material stream of interest. The evaluation of the different sensor types outlines that only imaging sensors meet the requirements of recycling stream monitoring and can deliver sufficient signal quality for subsequent mechanical sorting controls. Requirements for the setup parameters were discussed leading to the setup recommendation of a fast snapshot camera with a sufficiently high spectral resolution and signal-to-noise ratio. [ABSTRACT FROM AUTHOR]

The Physica Status Solidi A journal has published a special issue containing manuscripts from the GADEST 2024 conference, which focused on Gettering and Defect Engineering in Semiconductor Technology. The conference, established in 1985, brings together experts from academia and industry in the field of semiconductor technology. The conference covers a wide range of topics, including defects in materials and devices, nano-electronics, power electronics, and photovoltaics. The special issue includes original research on various aspects of defects in semiconductors, as well as improvements in defect investigation methods. The organizers express gratitude to the sponsors and welcome all participants to Germany. The authors of the article are Johannes Heitmann, Franziska Beyer, Daniel Hiller, Teimuraz Mchedlidze, and Matthias Müller. [Extracted from the article]