21 results on '"Meneghesso, Gaudenzio"'
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2. Modeling of the gate leakage in MOSFETs with Al2O3/β-Ga2O3 gate stack
3. Defects, performance, and reliability in UVC LEDs
4. Robustness and reliability of high-power white LEDs under high-temperature, high-current stress
5. Undestanding commercial UVC LEDs reliability to boost disinfection efficacy
6. V-Pits and Trench-Like Defects in High Periodicity MQWs GaN-Based Solar Cells: Extensive Electro-Optical Analysis
7. Physical insights into trapping effects on vertical GaN-on-Si trench MOSFETs from TCAD
8. On the CET-Map Ill-Posed Inversion Problem: Theory and Application to GaN HEMTs
9. Correlating Interface and Border Traps With Distinctive Features of C–V Curves in Vertical Al2O3/GaN MOS Capacitors
10. Modeling of the Electrical Characteristics and Degradation Mechanisms of UV-C LEDs
11. Modeling the Electrical Degradation of Micro-transfer-Printed 845 nm VCSILs for Silicon Photonics
12. Fast Characterization of Power LEDs: Circuit Design and Experimental Results
13. Undestanding commercial UVC LEDs reliability to boost disinfection efficacy
14. Defects, performance, and reliability in UVC LEDs
15. Lifetime-limiting mechanisms of integrated IR sources for silicon photonics
16. Influence of V-pits on the electro-optical properties of high-periodicity InGaN MQWs
17. TCAD Modeling and Simulation of Dark Current-Voltage Characteristics in High-Periodicity InGaN/GaN Multiple-Quantum-Wells (MQWs) Solar Cells
18. Positive VTH Shift in Schottky p-GaN Gate Power HEMTs: Dependence on Temperature, Bias and Gate Leakage
19. Correlating Interface and Border Traps With Distinctive Features of C–V Curves in Vertical Al2O3/GaN MOS Capacitors
20. Microwave and Millimeter-Wave GaN HEMTs: Impact of Epitaxial Structure on Short-Channel Effects, Electron Trapping, and Reliability
21. Semitransparent perovskite solar cells for Si tandem and agrivoltaic integration
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