4 results on '"Mootheri, Vivek"'
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2. Direct Assessment of Defective Regions in Monolayer MoS2 Field-Effect Transistors through In Situ Scanning Probe Microscopy Measurements
3. Direct Assessment of Defective Regions in Monolayer MoS2Field-Effect Transistors through In SituScanning Probe Microscopy Measurements
4. Direct Assessment of Defective Regions in Monolayer MoS 2 Field-Effect Transistors through In Situ Scanning Probe Microscopy Measurements.
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