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1. Advanced atomic force microscopy techniques V

Author

Philipp Rahe, Ilko Bald, Nadine Hauptmann, Regina Hoffmann-Vogel, Harry Mönig, and Michael Reichling

Subjects
afm, atomic force microscopy, conductivity, drift correction, force spectroscopy, nc-afm, non-contact atomic force microscopy, resistivity, tip–surface interaction, Technology, Chemical technology, TP1-1185, Science, Physics, QC1-999
Published
2025
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