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PurposeHashimoto’s thyroiditis (HT) is a significant public health concern, particularly among females. While existing studies have explored the correlation between serum iron levels and HT, limited research has specifically focused on this association in reproductive-age females. Our study aims to investigate the relationship between serum iron and HT.MethodsUsing data from the National Health and Nutrition Examination Survey (NHANES) database (2007–2012), we employed weighted multivariate logistic regression models, an XGBoost model, and smooth curve fitting. We assessed the correlation between serum iron and HT and examined linear and non-linear relationships with thyroid peroxidase antibodies (TPOAb) and thyroglobulin antibodies (TgAb).ResultsAmong 2,356 participants, each unit increase in serum iron was associated with a 43% reduced risk of HT (Odds Ratios (OR) 0.574; 95% Confidence Interval (CI) 0.572, 0.576). Quartile analysis confirmed these effects. The XGBoost model identified serum iron as the most significant variable correlated with HT. Smooth curves revealed a linear association between log2-transformed serum iron and HT. Additionally, log2-transformed serum iron inversely correlated with TPOAb levels (β −15.47; 95% CI -25.01, −5.92), while a non-linear relationship was observed with TgAb.ConclusionOur study reveals that in reproductive-age women, every unit increase in serum iron is associated with a 43% lower risk of HT, demonstrating an inverse relationship. Additionally, serum iron exhibits a negative correlation with TPOAb and a non-linear association with TgAb.

Abstract ETV6::RUNX1 is the most common fusion gene in childhood acute lymphoblastic leukaemia (ALL) and is associated with favorable outcomes, especially in low‐risk children. However, as many as 10% of children relapse within 3 years, and such early relapses have poor survival. Identifying children at risk for early relapse is an important challenge. We interrogated data from 87 children with low‐risk ETV6::RUNX1‐positive B‐cell ALL and with available preserved bone marrow samples (discovery cohort). We profiled somatic point mutations in a panel of 559 genes and genome‐wide transcriptome and single‐nucleotide variants. We found high TIMD4 expression (> 85th‐percentile value) at diagnosis was the most important independent prognostic factor of early relapse (hazard ratio [HR] = 5.07 [1.76, 14.62]; p = 0.03). In an independent validation cohort of low‐risk ETV6::RUNX1‐positive B‐cell ALL (N = 68) high TIMD4 expression at diagnosis had an HR = 4.78 [1.07, 21.36] (p = 0.04) for early relapse. In another validation cohort including 78 children with low‐risk ETV6::RUNX1‐negative B‐cell ALL, high TIMD4 expression at diagnosis had an HR = 3.93 [1.31, 11.79] (p = 0.01). Our results suggest high TIMD4 expression at diagnosis in low‐risk B‐cell ALL in children might be associated with high risk for early relapse.

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A pure nickel film and a carbon/nickel (C/Ni) composite film were produced using radio frequency magnetron sputtering. The structure of the films was regulated by adjusting the sputtering power and the time allocation of sputtering nickel and graphite targets. Furthermore, a scanning electron microscope, an x-ray diffractometer, and a Raman spectrometer were employed for sample characterization. The results demonstrated that the thickness of the pure nickel film and C/Ni composite film with a total deposition time of 60 s was between 44.96 and 65.31 nm. The nickel film exhibited preferential growth along the crystal plane (111), and the structure of carbon materials was in the second stage of the three-stage model known as “amorphization trajectory of graphite.” The prepared films’ electromagnetic interference shielding effectiveness (EMI SE) in the X-band was investigated using a vector network analyzer. It was observed that the C/Ni composite film with a thickness of 44.96 nm demonstrated a superior EMI SE with a maximum value reaching 21 dB. The EMI SE of the C/Ni composite film can reach the same performance and even exceed that of the pure nickel film obtained at the power of 200 W for 60 s in certain frequency segments. In conclusion, the pure nickel film can be replaced by C/Ni composite film prospectively due to their excellent EMI SE along with advantages such as reduced thickness, lighter weight, and lower cost.