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Start Over Author "Khanal, Subash" Publisher aalto university
1 results on '"Khanal, Subash"'

1. Thermal characterisation as a part of reliability testing of THz schottky diodes

Author

Kiuru, Tero, Khanal, Subash, Mallat, Juha, Räisänen, Antti V., Närhi, Tapani, Sihvola, Ari H., and Wallén, Henrik

Abstract

This paper presents the most common thermal characterisation methods for semiconductor diodes and discusses why thermal characterisation is important for the diode reliability assessment. A special case of thermal characterisation of THz frequency Schottky diodes for MetOp Second Generation (MetOp-SG) satellite program instruments is covered in more detail. The benefits of accurate thermal characterisation in this case are explained and the drawbacks of unknown self-heating are discussed

Published
2013

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