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A vertical constrained vapor bubble, VCVB, made of fused silica was used to study the stability and oscillations of an evaporating wetting film of HFE- 7000® in a corner. The film thickness profile was measured as a function of time and axial position using an advanced form of image analyzing interferometry. The curvature, apparent contact angle, and pressure profiles for the evaporating film were calculated from the measured film thickness profiles. Oscillation of the liquid film was observed and profiles for both the advancing and receding films were obtained. These are the first such detailed profiles obtained for an oscillating meniscus below a thickness of 0.1 μm.The film thickness profiles demonstrated the spreading of the meniscus during advance as well as the presence of a curvature gradient near the contact line region. The maximum curvature decreased for the advancing menisci and increased with time for the receding menisci. An increase in the adsorbed film thickness was associated with the advancing stage and a decrease with the receding stage. Pressure profiles were measured as a function of position indicating the potential for driving the flow of the fluid toward or away from the contact line. As the film advances or recedes, the pressure gradients change as a function of position fueling the next oscillation cycle. [Copyright &y& Elsevier]