1. Application of the quantum Hall effect to resistance metrology
- Author
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Poirier, Wilfrid, Schopfer, Félicien, Guignard, Jérémie, Thévenot, Olivier, and Gournay, Pierre
- Subjects
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QUANTUM Hall effect , *METROLOGY , *COMPARATOR circuits , *SEMICONDUCTORS , *GRAPHENE , *CAPACITORS , *LOW temperature engineering , *ELECTRIC currents - Abstract
Abstract: The quantum Hall effect (QHE) discovery has revolutionized metrology by providing with a representation of the unit of resistance, , that can be reproduced within a relative uncertainty of one part in 109 and is theoretically only linked to Planckʼs constant h and the electron charge e. This breakthrough also results from the development of resistance comparison bridges using cryogenic current comparator (CCC). The QHE experimental know-how now allows the realization of perfectly quantized Quantum Hall Array Resistance Standards (QHARS) by combining a large number of single Hall bars. In the context of an evolution of the Système International (SI) of units by fixing some fundamental constants of physics, the determination of the von Klitzing constant through the use of the so-called Thompson–Lampard calculable capacitor and the realization of refined universality tests of the QHE are of prime importance. Finally, the fascinating graphene material might be a new turning point in resistance metrology. [Copyright &y& Elsevier]
- Published
- 2011
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