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1. Evaluation of a SOI pixel sensor with thick depletion layer for future X-ray astronomical missions

Author

Takeshi Go Tsuru, Ayaki Takeda, Toshinobu Miyoshi, R. Ichimiya, Takafumi Ohmoto, Toshifumi Imamura, Shinya Nakashima, Atsushi Iwata, Sykyo Gando Ryu, Yoshio Arai, and Y. Ikemoto

Subjects
Physics, Full width at half maximum, Optics, Pixel, Depletion region, business.industry, Dispersion (optics), Silicon on insulator, business, Standard deviation, Energy (signal processing), Voltage
Abstract

We report on the evaluation test of our novel pixel sensor named "XRPIX1-FZ" which is developed for the future X-ray astronomy mission. The mean gain of XRPIX1-FZ is 3.3 µV/e. and the dispersion of the gain among the pixels is 1% in the standard deviation. We confirmed the energy resolution of 260 eV in FWHM at 8 keV. We achieved the full depletion (250 µm) at 30 V back bias voltage.

Published
2012
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