20 results on '"Endo, Katsuyoshi"'
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2. Simultaneous measurement of fine pattern shape and overall shape by a nano-profiler
3. Spiral scanning nano-profiler using normal vector tracing method
4. On-machine self-calibration of rotary encoders in the normal vector tracing method
5. Atomic-scale and pit-free flattening of GaN by combination of plasma pretreatment and time-controlled chemical mechanical polishing
6. Comparison of thermal oxidation and plasma oxidation of 4H-SiC (0001) for surface flattening
7. Erratum: “Atomic-scale planarization of 4H-SiC (0001) by combination of thermal oxidation and abrasive polishing” [Appl. Phys. Lett. 103, 111603 (2013)]
8. Atomic-scale planarization of 4H-SiC (0001) by combination of thermal oxidation and abrasive polishing
9. Hydrogen termination of Si(110) surfaces upon wet cleaning revealed by highly resolved scanning tunneling microscopy
10. Improvement of the thickness distribution of a quartz crystal wafer by numerically controlled plasma chemical vaporization machining
11. Fabrication of elliptically figured mirror for focusing hard x rays to size less than 50nm
12. Relative angle determinable stitching interferometry for hard x-ray reflective optics
13. Atomic-scale analysis of hydrogen-terminated Si(110) surfaces after wet cleaning
14. Fabrication of elliptical mirror at nanometer-level accuracy for hard x-ray focusing by numerically controlled plasma chemical vaporization machining
15. Microstitching interferometry for x-ray reflective optics
16. Atomic image of hydrogen-terminated Si(001) surfaces after wet cleaning and its first-principles study
17. Atomically resolved scanning tunneling microscopy of hydrogen-terminated Si(001) surfaces after HF cleaning
18. Atomic structures of hydrogen-terminated Si(001) surfaces after wet cleaning by scanning tunneling microscopy
19. Ultra high vacuum compatible metal ion beam surface modification system
20. A design of large current ion gun employing liquid metal ion source
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