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Activation of implanted donors into a highly-resistive, nitrogen-doped homoepitaxial β-Ga2O3 has been investigated. Nitrogen acceptors with the concentration of ∼1017 cm−3 were incorporated during epitaxial growth yielding low-doped (net donor concentration 14 cm−3) films subsequently implanted with Si, Ge, and Sn. Upon Ohmic contact formation to the implanted regions, sheet resistance values of 314, 926, and 1676 Ω/sq were measured at room temperature for the Si-, Ge-, and Sn-implanted samples, respectively. Room temperature Hall measurements resulted in sheet carrier concentrations and Hall mobilities of 2.13 × 1014 /93, 8.58 × 1013/78, and 5.87 × 1013/63 cm2/(V s), respectively, for these three donor species. Secondary ion mass spectroscopy showed a volumetric dopant concentration of approximately 2 × 1019 cm−3 for the three species, resulting in carrier activation efficiencies of 64.7%, 40.3%, and 28.2% for Si, Ge, and Sn, respectively. Temperature-dependent Hall effect measurements ranging from 15 to 300 K showed a nearly constant carrier concentration in the Si-implanted sample, suggesting the formation of an impurity band indicative of degenerate doping. With a bulk carrier concentration of 1.3 × 1019 cm−3 for the Si implanted sample, a room temperature mobility of 93 cm2/(V s) is among the highest reported in Ga2O3 with a similar carrier concentration. The unimplanted Ga2O3:N regions remained highly resistive after the surrounding areas received implant and activation anneal. These results open the pathway for fabricating Ga2O3 devices through the selective n-type doping in highly resistive epitaxial Ga2O3.

Cubic boron arsenide (c-BAs) exhibits an ultrahigh thermal conductivity (κ) approaching 1300 Wm−1 K−1 at room temperature. However, c-BAs is believed to incorporate high concentrations of crystal imperfections that can both quench κ and act as sources of unintentional p-type conductivity. Although this behavior has been attributed to native defects, we show here, using optical and magnetic resonance spectroscopies together with first-principles calculations, that unintentional acceptor impurities such as silicon and/or carbon are more likely candidates for causing the observed conductivity. These results also clarify that the true low-temperature bandgap of c-BAs is 0.3 eV higher than the widely reported value of ∼1.5 eV. Low-temperature photoluminescence measurements of c-BAs crystals reveal impurity-related recombination processes (including donor-acceptor pair recombination), and electron paramagnetic resonance experiments show evidence for effective mass-like shallow acceptors. Our hybrid density functional calculations indicate that native defects are incapable of giving rise to such signals. Instead, we find that group-IV impurities readily incorporate on the As site and act as shallow acceptors. Such impurities can dominate the electrical properties of c-BAs, and their influence on phonon scattering must be considered when optimizing thermal conductivity.

Cubic boron arsenide (c-BAs) has been predicted to exhibit thermal conductivity values around 1400 W/m-K at room temperature by first-principles calculations and, thus, shows promise to be one of the solutions for the thermal management challenge faced by the semiconductor industry. However, the size of single crystals of c-BAs in reported growth efforts is still less than 1 mm. In addition, the measured thermal conductivity is well below the predicted value due to the presence of defects in the grown crystal. Here we report the growth of c-BAs single crystals up to a few mm by the chemical vapor transport technique based on a TeI4 transport agent under gas pressures up to 8 atm. Raman spectroscopy revealed a sharp P1 phonon mode, suggesting good crystalline quality. High-angle annular dark-field scanning transmission electron microscopy revealed the AsB (As-atom on B) and BAs (B-atom on As) antisite pairs. A bulk thermal conductivity value of 133 ± 17 W/m-K at 300 K was obtained using steady-state comparative measurements. Although the bulk thermal conductivity is still one order of magnitude lower than the calculation, the ability to increase the size of the crystal is an important step toward the synthesis of high quality bulk c-BAs crystals.

We have grown c-BAs single crystals up to 1000 μm size by the chemical vapor transport (CVT) technique using combined As and I2 transport agents with the As:I ratio of 1:3 under gas pressures of up to 35 atm. Raman spectroscopy revealed a very sharp (∼2.4 cm−1) P1 phonon mode and an interesting splitting behavior of P1 from detailed polarization studies. Electron paramagnetic resonance (EPR) experiments revealed no evidence for EPR active growth-related defects under the experimental resolution. Finally, a moderate thermal conductivity value of ∼132 W/m-K was obtained using a transient thermal grating technique. These results suggest that although the high As gas vapor pressure environment in CVT growth can increase the transport rate of c-BAs significantly, it may not be efficient in reducing the defects and enhancing the thermal conductivity in c-BAs significantly.

The authors would like to acknowledge the support of a U. S. NICOP Contract, No. N00014-99-1-GO17 sponsored through the U. S. Office of Naval Research. One of the authors (K.S.A.B.) would like to further acknowledge the support of a Macquarie University Research Fellowship.

Cathodoluminescence experiments were performed on a high-quality AlN epitaxial film grown by organometallic vapor phase epitaxy on a large single crystal AlN substrate. The low-temperature near-bandedge spectra clearly show six very narrow lines. The thermal quenching behavior of these emission lines provides insight on how to assign them to free and bound exciton recombination processes. The binding energy for the free-exciton-A in AlN was found to be nearly twice that in GaN. The observation of the free-exciton-A first excited state permitted us to estimate its reduced effective mass and, by using recent reported values for the hole effective mass in Mg-doped AlN, the electron effective mass in AlN has been deduced.

The real dielectric constant for chemical vapor deposition 3C‐SiC grown on silicon (Si) has been determined at 300 K and at 5 K from an analytic fit to interference fringes in transmission over the spectral range from the near infrared to the submillimeter region. This technique is capable of high accuracy being limited typically by the sample thickness and accuracy with which the thickness is measured. The resulting real dielectric constant is lower than the values usually attributed to this material. We find: at 300 K e 0=9.52 and e ∞=6.38; at 5 K e0=9.28 and e ∞=6.22. In all cases the estimated error is ±0.8%. The observed ratio e0 /e∞ agrees with the Lyddane–Sachs–Teller relation to 0.1% at 300 K and 0.2% at 5 K.

This paper presents the homoepitaxial growth of phase pure (010) β-Ga2O3 thin films on (010) β-Ga2O3 substrate by low pressure chemical vapor deposition. The effects of growth temperature on the surface morphology and crystal quality of the thin films were systematically investigated. The thin films were synthesized using high purity metallic gallium (Ga) and oxygen (O2) as precursors for gallium and oxygen, respectively. The surface morphology and structural properties of the thin films were characterized by atomic force microscopy, X-ray diffraction, and high resolution transmission electron microscopy. Material characterization indicates the growth temperature played an important role in controlling both surface morphology and crystal quality of the β-Ga2O3 thin films. The smallest root-mean-square surface roughness of ∼7 nm was for thin films grown at a temperature of 950 °C, whereas the highest growth rate (∼1.3 μm/h) with a fixed oxygen flow rate was obtained for the epitaxial layers grown at 850 °C.

Low (keV) and high (MeV) energy Al and B implants were performed into n‐type 6H‐ and 3C‐SiC at both room temperature and 850 °C. The material was annealed at 1100, 1200, or 1400 °C for 10 min and characterized by secondary ion mass spectrometry, Rutherford backscattering (RBS), photoluminescence, Hall and capacitance‐voltage measurement techniques. For both Al and B implants, the implant species was gettered at 0.7 Rp (where Rp is the projected range) in samples implanted at 850 °C and annealed at 1400 °C. In the samples that were amorphized by the room temperature implantation, a distinct damage peak remained in the RBS spectrum even after 1400 °C annealing. For the samples implanted at 850 °C, which were not amorphized, the damage peak disappeared after 1400 °C annealing. P‐type conduction is observed only in samples implanted by Al at 850 °C and annealed at 1400 °C in Ar, with 1% dopant electrical activation.

Self-nucleated bulk AlN crystals were grown by thermodecomposition of AlCl3⋅NH3 vaporized in the low-temperature zone of a two-zone furnace. X-ray diffraction of the AlN crystals show single lines with a small linewidth indicating high single-crystalline quality. Polarized Raman scattering experiments of these samples confirm the x-ray results based on the detection of a small linewidth for all allowed optical phonons. Low-temperature cathodoluminescence spectra show very sharp emission bands close to the optical band gap, which have been assigned to free-excitons A and B, and exciton-bound to shallow neutral impurity. The latter has a full width at half maximum smaller than 1.0 meV.

Turbulent premixed oxygen‐acetylene flames have been used to synthesize polycrystalline diamond films on molybdenum substrates at temperatures ranging from 500 to 1300 °C and facetted single crystals on mm‐sized natural diamond substrates at temperatures of 1200–1300 °C. Turbulence was achieved by increasing the torch’s orifice diameter and/or the flow velocity; the presence of turbulence was confirmed by observations of changes in the flame shape, measurements of the flame’s noise spectrum, and calculations of the Reynolds number. The optical emission spectra of several diamond‐growing turbulent flames were also compared to the spectra of laminar flames. The variation in diamond quality with temperature and oxygen acetylene flow ratio was studied with one or more of the following techniques: Raman spectroscopy, scanning and transmission electron microscopy, infrared spectroscopy, and photoluminescence spectroscopy. Crystals grown on molybdenum at temperatures of 600–1100 °C were observed to be transparen...

Donor impurity excitation spectra in the infrared from two high-quality, not-intentionally doped, hydride-vapor-phase epitaxial GaN wafers are reported. Two previously observed shallow donors which we designate N1 and N2 were observed in both wafers. However, spectra of one wafer are dominated by N1 and spectra of the other by N2. A comparison of infrared and secondary ion mass spectroscopic data allows identification of N1 as Si and N2 as O. Silicon is the shallowest uncompensated donor in these samples with an activation energy of 30.18±0.1 meV in the freestanding Samsung wafer. The activation energy of O is found to be 33.20±0.1 meV. An unidentified third donor with an activation energy of 31.23±0.1 meV also was observed. Integrated absorption cross sections are found to be 8.5×10−14 cm for Si and 8.6×10−14 cm for O.

Deep traps responsible for current collapse phenomena in GaN metal–semiconductor field-effect transistors have been detected using a spectroscopic technique that employs the optical reversibility of current collapse to determine the photoionization spectra of the traps involved. In the n-channel device investigated, the two electron traps observed were found to be very deep and strongly coupled to the lattice. Photoionization thresholds for these traps were determined at 1.8 and at 2.85 eV. Both also appear to be the same traps recently associated with persistent photoconductivity effects in GaN.

Electrical, optical, and structural properties of Si-doped GaN films grown on multiple AlN interlayers (IL) sandwiched between high-temperature (HT) GaN are presented. We show that as the number of AlN IL/HT GaN layers increases, the electron mobility increases in the top Si-doped GaN layer, showing a near doubling from 440 to 725 cm2 V−1 s−1. Cross-sectional transmission electron microscopy images reveal a significant reduction in the screw dislocation density for GaN films grown on the AlN IL/HT GaN layers. The symmetric and off-axis x-ray linewidths increase as the number of AlN IL/HT GaN layers increase, indicating a greater relative misalignment of the adjacent HT GaN layers. Photoluminescence spectra of undoped and Si-doped GaN films on the multiple AlN IL/HT GaN layers have small yellow-band intensity. Analysis based on a single-donor/single-acceptor model for the electrical conduction suggests that the improved electron mobility is the result of a reduced acceptor concentration in the top GaN film...

Two distinct spectra are reported from an optically detected magnetic resonance study of epitaxial films of cubic SiC. The first is a Lorentzian, single line with g=2.0065±0.0015, which is strong in Al‐doped SiC. This line is attributed to residual donors. The second spectrum, observed in both Al‐doped and undoped samples, is dominated by a pair of exchange‐split lines with g=2.0024 and a=0.095 cm−1. Although a definite assignment of this spectrum cannot be made, spectral dependence studies show it is associated with a defect‐related luminescence band in the energy range from 1.6 to 1.9 eV.

We report the observation of significant enhancement in the electrical and crystalline properties of GaN layers grown on vicinally cut, a-plane sapphire substrates. Room-temperature Hall mobility and x-ray rocking curve data show a nearly twofold improvement, independent of the processing conditions, for layers grown on substrates having vicinal angles of 1.5° compared to on-axis substrates. Transmission electron microscopy shows reduced edge dislocation density and better alignment of the grains in layers grown on vicinally cut substrates. Preliminary photoluminescence measurements also indicate pronounced differences in the yellow band spectra between the on-axis and off-axis cut substrates. These findings contrast the relatively modest improvements observed in layers grown on c-plane substrates with vicinal angles as high as 10°.

The optical properties of homoepitaxial GaN layers deposited by organometallic vapor phase epitaxy on stripe-patterned GaN films on 6H-SiC substrates have been investigated. Analysis of the spatially-resolved Raman scattering spectra indicate an improvement in material quality of the overgrown region. Room-temperature color cathodoluminescence imaging and low-temperature photoluminescence measurements indicate that a donor and an acceptor, different from those detected in the underlying GaN/AlN/SiC substrate, have been incorporated in the epitaxial layer. Detailed photoluminescence studies of the near-band-edge emission strongly suggest that Si is the additional donor detected in the homoepitaxial GaN layer. Its occurrence, along with that of an acceptor-related defect which is primarily found in the laterally overgrown region, is discussed.

Persistent photoconductivity has been observed in n-type GaN:Si. The effect is seen at room temperature in both nonoptimally grown films as well as in device quality channel layers. The relaxation dynamics are found to agree with a stretched exponential model of recovery. A comparison between different samples, based upon stretched exponential parameters, Hall measurements, and photoluminescence data is made. The data suggest that the cause of persistent photoconductivity is the same among the different samples and that there is a transition in the relaxation dynamics between room temperature and 130 °C.

An electron paramagnetic‐resonance study of diamond films doped by implantation of phosphorus during film deposition is reported. Samples with nominal phosphorus concentration between 1016 and 1017 cm−3 exhibit two isotropic lines of equal intensity separated by 27 G. The double‐line spectrum is expected for a nuclear‐spin 1/2 species such as phosphorus. The symmetry of the center and the temperature dependence of the spin concentration suggest that phosphorus forms a substitutional shallow donor in diamond.

Steady state and time resolved photoluminescence studies of type IIb boron‐doped synthetic diamond reveal a new broad red emission band that exhibits many of the features of classic donor–acceptor pair recombination. This recombination is thought to be between an as‐yet unidentified neutral donor, possibly nitrogen related, approximately 3.6 eV below the conduction band edge and neutral boron acceptors at 0.37 eV above the valence band edge.

Optically detected magnetic resonance has been observed from GaN. Two magnetic resonances have been detected on the 2.2 eV‐deep photoluminescence band. The first resonance is sharp [full width at half‐maximum (FWHM) ∼2.2 mT] with g∥=1.9515±0.0002 and g⊥=1.9485±0.0002 and is assigned to conduction electrons, in agreement with recent electron paramagnetic resonance (EPR) studies of similar samples. The second feature, which has not been seen by EPR, is much broader (FWHM∼13 mT) with g∥=1.989±0.001 and g⊥=1.992±0.001. These parameters indicate a deep state. A tentative assignment is made to a deep state associated with the N vacancy.

Single crystal GaN thin films resulting from various deposition techniques are usually dominated by residual donors. To date, the true nature of this donor conduction is not known. Nitrogen vacancies, residual oxygen, and growth defects are cited as potential causes for the residual n‐type conduction. In this communication we present the first systematic study of near conduction band edge states in n‐type GaN samples deposited over basal plane sapphire substrates using low pressure metal organic chemical vapor deposition. Electron spin resonance, low temperature photoluminescence, and Van der Pauw–Hall measurements were used as the basis for our study. We concluded that the residual n‐type conduction in GaN results from a band of delocalized donors.

The indirect band gap of icosahedral B12As2 (IBA) has been determined by variable temperature photoluminescence measurements (8 K-294 K) on solution-grown bulk samples. In addition, evidence of three shallow acceptor levels and one shallow donor level is reported. The low-temperature spectra were characterized by broad and intense deep defect emission, donor-acceptor pair (DAP) bands, and exciton recombination. The appearance of DAP emission verifies the incorporation of a donor in IBA, which has not been reported previously. The temperature dependence of the free exciton (FE) intensity reflected a FE binding energy of 45 meV. The variation of the FE peak position with temperature was fitted with both Varshni and Passler models to determine an expression for the temperature dependence of the indirect band gap. The resulting low and room temperature band gaps are Eg(0) = 3.470 eV and Eg(294 K) = 3.373 eV, respectively. The latter is not consistent with previous reports of the room temperature band gap, 3.2...

Local recombination properties of threading screw and edge dislocations in 4H–SiC epitaxial layers have been studied using electron beam induced current (EBIC). The minority carrier diffusion length in the vicinity of dislocations was found to vary with dislocation type. Screw dislocations had a more pronounced impact on diffusion length than the edge dislocations, evidencing stronger recombination activity. Temperature dependence of EBIC contrast of dislocations suggests that their recombination activity is controlled by deep energy levels in the vicinity of dislocation cores. This paper shows that the type of dislocation (screw or edge) can be identified from analysis of EBIC contrast.

In-grown stacking faults in n-type 4H-SiC epitaxial layers have been investigated by real-color cathodoluminescence imaging and spectroscopy carried out at room and liquid helium temperatures. Stacking faults with 8H stacking order were observed, as well as double layer and multilayer 3C-SiC structures and a defect with an excitonic band gap at 2.635 eV. It was found that 8H stacking faults and triangular surface defects can be generated from similar nucleation sources. Time-resolved measurements reveal that compared to defect-free regions, the carrier lifetimes are severely reduced by the presence of stacking faults corresponding to triangular surface defects and three-dimensional 3C-SiC inclusions.

Ni Schottky barrier contacts were processed to characterize quality and suitability of GaN films grown on (111) face of titanium carbide metallic substrates for vertical device application. We found that defects such as voids (pores) in the GaN film strongly influence the optical and electrical properties of the epitaxial layers. Micro-Raman studies showed that these voids have a high concentration of free carriers. Schottky barrier contacts placed on the regions with high defect density are characterized by high leakage current. Barrier height of Schottky contacts containing smaller number of defects were typically around 0.72eV.

The authors demonstrate here that GaN films with good surface morphology and structural, optical, and electronic properties can be grown on metallic titanium carbide substrates. X-ray rocking curve and Raman scattering measurements confirmed the high crystalline quality of the wurtzite structure film. Variable temperature photoluminescence measurements of sharp and intense emission lines provided insights into the nature of the recombination processes, the carrier background type, and the carrier concentration. The high quality of the interface and substrate Ohmic contacts was verified. The ability to grow high-quality films on metallic substrates provides the means for advanced vertical and high-power and/or high-temperature device fabrication.

The infrared dielectric function of wurtzite AlN has been determined by fitting an analytic Lorentzian dielectric function to experimentally observed interference fringes in infrared transmission. The analytic model is scaled to agree with recent measurements of the visible refractive index, and the experiment and model extend to the submillimeter range of the infrared. A complete, experimentally verified dielectric function is found from the visible to the submillimeter spectral region for radiation with E⊥c axis, and an analytic model is produced for E‖c axis. Refractive indices and extinction coefficients from the visible to zero frequency are presented.

Measurements of the temperature dependence of N‐Al donor‐acceptor pair photoluminescence spectra in cubic SiC films demonstrate that the thermal activation energy for the nitrogen donors is equivalent to the 54 meV binding energy for nitrogen determined from the spectral energies of the sharp‐line close pair spectra. It follows that the 15–20 meV donor which dominates the electrical properties of n‐type films is not isolated, substitutional nitrogen. Spatial variations observed in the intensity of a new 2.368 eV luminescence band demonstrate that the radiative recombination centers are inhomogeneously distributed in the films.