1. Photo-oxidation studies of porous silicon using a microcalorimetric method
- Author
-
Jarno Salonen, Ensio Laine, and Vesa-Pekka Lehto
- Subjects
Electron transfer ,Silicon ,Chemistry ,Band gap ,Relaxation (NMR) ,Analytical chemistry ,General Physics and Astronomy ,chemistry.chemical_element ,Irradiation ,Thermal treatment ,Bond energy ,Porous silicon - Abstract
We have used an isothermal microcalorimetric method to study photoinduced effects in porous silicon (PS). In the photo-oxidation investigations using constant wavelength, sharp threshold behavior with threshold energies 3.9 eV for n-PS and 4.7 eV for p+-PS were observed. The two discussed origins for the different threshold energies are based either on the energy gap transitions and enhanced electron transfer from the conduction band to the electron-affinity level of oxygen molecules, or the Si–O bond energy. Also nonlinear dependence on the irradiation intensity was found. Surprisingly, high exothermic signals were observed in measurements made under an inert perfusion. It is proposed that this is associated with relaxation of PS structure, which seems to be more efficiently induced by illumination than thermal treatment.
- Published
- 1999