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International audience; The chemistry and intermixing at buried interfaces in sputter deposited ZnO/Ti/ZnO thin layers were studied by hard x-ray photoelectron spectroscopy. The long mean free path of the photoelectrons allowed for detailed studies of the oxidation state, band bending effects, and intrinsic doping of the buried interfaces. Oxidation of the Ti layer was observed when ZnO was deposited on top. When Ti is deposited onto ZnO, Zn Auger peaks acquire a metallic character indicating a strong reduction of ZnO at the interface. Annealing of the stack at 200 C results in further reduction of ZnO and oxidation of Ti. Above 300 C, oxygen transport from the bulk of the ZnO layer takes place, leading to re-oxidation of ZnO at the interface and further oxidation of Ti layer. Heating above 500 C leads to an intermixing of the layers and the formation of a ZnxTiOy compound.

International audience; The in situ elastic and plastic behaviors of sodium aluminosilicate glasses with different degrees of depolymerization were analyzed using Brillouin spectroscopy. The observed elastic anomaly progressively vanished with depolymerization. The densification process appears to be different from that observed in pure silica glass. In the plastic regime of densified glasses hysteresis loops were observed and related to modification of the local silicon environment facilitated by the addition of sodium.

International audience; In nanoimprint lithography (NIL) viscous flow in polymeric thin films is the primary mechanism for the generation and the relaxation of the structures. Here we quantify the impact of confinement on the flow rate. Pattern relaxation experiments were carried out above the glass transition temperature as a function of film thickness. The results are adequately fitted by a simple expression for the flow rate valid at all confinements. This expression, based on Newtonian viscosity, should be of use in NIL process design and for the measurement of the rheological properties of confined polymers.

International audience; Inclined GaSb nanopillars prepared by low energy ion sputtering with oblique ion beam incidence have been characterized by two different Mueller matrix ellipsometric tools. The optical properties of the nanopillars were found to be well described by a uniaxial anisotropic graded effective medium model. The pillar height and inclination angle were determined by fitting the parameters of the effective medium model to spectroscopic (1.44-2.88 eV) Mueller matrix measurements at multiple azimuth sample orientations. A set of different samples with various average pillar height and inclination angle was studied; results from the optical characterization correspond well with those from scanning electron microscopy analysis. For samples with nanopillars inclined by 45 degrees or less, the height could be determined from a single Mueller matrix measurement at only one azimuth orientation, allowing real-time in situ observation of the formation. The nanopillars were also studied using a single wavelength angle resolved Mueller polarimeter, which also can be used to determine height and inclination of the pillars, in addition to validating the optical model over a wide range of incident and azimuth angles.