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Arrays of graphene or few-layer graphene quantum dots (QDs) embedded in a partially fluorinated graphene matrix were created by chemical functionalization of layers. Charge transient spectroscopy employed for investigation of obtained QD systems (size 20–70 nm) has allowed us to examine the QD energy spectra and the time of carrier emission (or charge relaxation) from QDs as a function of film thickness. It was found that the characteristic time of carrier emission from QDs decreased markedly (by about four orders of magnitude) on increasing the QD thickness from one graphene monolayer to 3 nm. Daylight-assisted measurements also demonstrate a strong decrease of the carrier emission time.

The passivating effects of organic monolayers of 1-octadecene deposited onto the silicon surfaces of both n and p conductivities were studied for Si∕SiGe∕Si structures grown by molecular beam epitaxy and chemical vapor deposition. Measurements of the capacitance versus voltage and current versus voltage were made on structures covered with the organic monolayer and compared with unpassivated structures covered with native silicon dioxide. The results demonstrate that the organic passivation provides a decrease of surface charge and an increase of carrier concentration in the near-surface layers and/or the SiGe quantum wells.