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Start Over Author "Schmidt-Hansberg, B." Publisher american institute of physics, inc.
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1. In situ monitoring the drying kinetics of knife coated polymer-fullerene films for organic solar cells

Author

Schmidt-Hansberg, B., Klein, M.F.G., Peters, K., Buss, F., Pfeifer, J., Walheim, S., Colsmann, A., Lemmer, U., Scharfer, P., and Schabel, W.

Subjects
Atomic force microscopy -- Usage, Physics
Abstract

Atomic force microscopy (AFM) and optical in situ thin film drying measurements are used for examining the strong impact of distinct drying scenarios on the polymer:fullerene bulk heterojunction (BHJ) layer morphology. The studies have helped in understanding the film formation kinetics and prerequisites for the systematic optimization of the film morphology in solution processed organic photovoltaic devices.

Published
2009

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