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Start Over Author "Armstrong, Michael J." Publisher american institute of physics
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1. Island films resulting from ion bombardment: Spectroscopic ellipsometry and Auger electron spectroscopy.

Author

Armstrong, Michael J. and Muller, Rolf H.

Subjects
*ION bombardment, *THIN films, *LEAD, *ELECTRON spectroscopy, *SCANNING electron microscopy
Abstract

Presents a study that examined the effect of ion bombardment on the morphology of compact lead films. Analysis of the Auger electron spectra; Evaluation of the scanning electron micrographs; Measurement of the optical properties of the lead film.

Published
1989
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