1. Atomic scale patterns formed during surface scanning by atomic force microscopy tips.
- Author
-
Teschke, Omar, Soares, David Mendez, Valente Filho, Juracyr Ferraz, and de Souza, Elizabeth Fátima
- Subjects
- *
ATOMIC force microscopy , *INTERFACES (Physical sciences) , *NANOSTRUCTURED materials , *DIELECTRIC measurements , *OSCILLATIONS - Abstract
In this work, tip sliding at the water/substrate interfacial region was used to investigate the pattern observed during image acquisition with atomic resolution in atomic force microscopy. The process responsible for the pattern formation is the oscillatory movement of the tip in the direction that is normal to scanning induced by a change in the water interfacial dielectric permittivity from [variant_greek_epsilon]≈4 at the interface to [variant_greek_epsilon]≈80 (bulk value) that results in a variation of the measured force acting on the tip of ≈30 pN. [ABSTRACT FROM AUTHOR]
- Published
- 2006
- Full Text
- View/download PDF