1. Hard X-Ray Nanofocusing Using Total-Reflection Zone Plates.
- Author
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Hidekazu Takano, Takuya Tsuji, Atsuyuki Matsumura, Kenji Sakka, Yoshiyuki Tsusaka, and Yasushi Kagoshima
- Subjects
- *
ZONE plates , *TOTAL internal reflection (Optics) , *SYNCHROTRONS , *X-ray diffraction , *DIFFRACTION gratings - Abstract
A total-reflection zone plate (TRZP), which is a reflective grating that generates a line focus of hard X-rays, was developed. Newly designed TRZPs, introducing a laminar grating concept, were fabricated with various zone parameters. The focusing performances with regard to the beam size and the diffraction efficiency were evaluated using synchrotron radiation X-rays of 10 keV energy. Although the beam sizes measured are insufficient in comparison with the ideal value, the maximum diffraction efficiency, measured at 20%, exceeds the limitations of conventional TRZPs based on a binary grating. [ABSTRACT FROM AUTHOR]
- Published
- 2015
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