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Focuses on a study which simulated the formation process and the shape of a magnetic domain on a moving magneto-optical disk. Theoretical framework; Results and discussions; Conclusion.

Presents a study which examined the angular distribution of the sputtered TbFeCo atoms. Mathematical equations for mass distribution in the film; Sputter targets used in the study; Results and discussion.

Presents a study that introduced methods for measuring magneto-optical Kerr rotation at normal incidence. Implementation of the methods on an ellipsometer; Background on Kerr rotation; Details of the methods.

Ge/Au bilayer thin films were fabricated by magnetron sputtering method, the temperature dependence of resistance from room temperature to 500 °C and concentration depth profiles are measured. From the temperature dependence of resistance measurement, we found two phase change phenomena which occurred at 175 and 360 °C. The element concentration depth profiles of the as-deposited and recorded region indicate that the Au–Ge alloy is initially formed at the Ge/Au interface. The dominant diffusion element is Au atom and the diffusion path is from Au layer to Ge layer. The optimum simulated bit error rate value is about 1.4×0-6 at 9.0 mW under two time high definition digital versatile disk (HD DVD) recording speed. The dynamic tests show that this Ge/Au bilayer films can be applied to one to two times HD DVD-R. [ABSTRACT FROM AUTHOR]

The recording mechanism of Ge/Au bilayer and its dynamic tests for write-once blue laser high density DVD (HD DVD) are investigated. It is found that Ge2Au3 phase is nucleated between amorphous Ge and crystalline Au layer after room temperature deposition. Crystallization of Ge/Au interface layer at 170–190 °C is induced by the nucleated Ge2Au3 sites at the interface, the bilayer structure is further heated to 200–450 °C. After heating above 320 °C, crystallized Ge are segregated at the grain boundary. The dynamic test results show that this Ge/Au bilayer films can be applied to 1×–2× HD DVD-R. [ABSTRACT FROM AUTHOR]