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The dark-field image (DFI) in a grating interferometer involves the small-angle scattering properties of a material. The microstructure of the material can be characterized by an analysis of the auto-correlation length and the DFI. The feasibility of a DFI in a laboratory x-ray source with grating interferometry has been reported, but a follow-up study is needed. In this study, the random stress distribution was measured in the laboratory environment as an applied study. SiO2 mono-spheres as a cohesive powder with a 0.5 µm particle size were used as the sample. The microstructural changes according to the stresses on the particles were observed by acquiring a DFI along the auto-correlation length. In x-rays, a random two-phase media model was first used to analyze the characteristics of cohesive powder. This study showed that the microstructure of materials and x-ray images could be analyzed in a laboratory environment. [ABSTRACT FROM AUTHOR]

The morphology of vortex lattice domains in bulk type-II/1 superconductors is of central interest for many areas such as fundamental condensed matter physics, engineering science, and the optimization of materials for high transport current superconductivity applications. Here, we present a comprehensive experimental study of a single crystal niobium in the intermediate mixed state and Shubnikov phase with two complementary neutron techniques: high resolution polarized neutron imaging and small-angle neutron scattering. In this way, we were able to identify and visualize the occurrence of compensating currents, the flux line closure, and the freezing of the vortex spacing during the process of field cooling and high field cooling. With the combination of complementary neutron techniques, it was possible to add insights into the quest for the understanding of the flux pinning and nucleation of vortices in type-II/1 superconductors during the process of field cooling and high field cooling. [ABSTRACT FROM AUTHOR]

A symmetric Talbot-Lau neutron grating interferometer has been developed for achieving high phase sensitivity. The gratings for the interferometer have been designed by maximizing the intergrating distances available at the experimental facility and optimizing the period of the gratings. The phase sensitivity in a Talbot-Lau grating interferometer has been mathematically modeled and analyzed and compared with experimental data. Evaluation experiments have been performed at the cold neutron imaging facility of the NIST Center for Neutron Research. The symmetric Talbot-Lau neutron grating interferometer exhibits distinct advantages in terms of high sensitivity and wide range for dark-field contrast imaging. Also, the fabrication of gratings is made easier, simpler, and more economical by the Gadox powder filling method, which gives them excellent phase contrast compared with other geometric Talbot-Lau neutron grating interferometers. [ABSTRACT FROM AUTHOR]

In this work, the authors developed a simple and efficient two-step deposition process for the realization of an x-ray absorption grating: ALD (atomic layer deposition) of a conductive seed layer, followed by electroplating of the absorbing metal with a pulse current mode. An Si grating with a high aspect ratio of 1:40 was fabricated by deep reactive ion etching on an 8 in. Si wafer. In order to form a conductive seed layer on the Si grating with such a high aspect ratio over an area of 10 × 10 cm2, Ru was conformally deposited by a thermal ALD process with O2 reactant gas. The authors analyzed the results of electroplating performed in different bias modes to fill Au in a high aspect ratio Si grating structure. It was found that electroplating in the pulse current mode (duty cycle: 5%, current density: 1.7 mA/cm2) for 79 h allowed Au to uniformly fill the entire grating area, whereas in the direct current mode, severe step coverage on top of the grating was observed. The authors successfully tested the grating fabricated by the suggested two-step deposition process as an absorption grating (G2) for a high x-ray energy Talbot-Lau grating interferometer. [ABSTRACT FROM AUTHOR]

A solution-processable electrode is a key component in flexible electronics. Despite recent studies on silver nanocrystal (Ag NC)-based electrodes with high conductivity, the absence of a strategy to control the work function has limited the development of low-cost and high-performance electronic devices. In this report, we introduce a chemical route to manipulate the work function of solution-processed Ag NC-based electrodes. The structural, chemical, optical, and electronic properties, as well as the work functions, of the Ag NC thin films treated with three types of halide ligands (Cl−, Br−, and I−) were investigated. Ultraviolet photoelectron spectroscopy analysis shows that the work functions are shifted to 4.76, 4.43, and 4.04 eV when the ligands are changed to Cl−, Br−, and I−, respectively. The trend in the shift induced by the halide ligands matches the results of atomistic density functional theory calculations and scales with the strength of the dipoles formed by the electron transfer at the NC/ligand interfaces. To demonstrate the impact of our strategy in device applications, we fabricated all-NC-based thin-film transistors and complementary metal-oxide-semiconductor inverters. This study provides a fundamental understanding of the surface states of nanomaterials and also offers technological benefits for the construction of low-cost, high-performance electronic devices. [ABSTRACT FROM AUTHOR]

The fabrication of gratings including metal deposition processes for highly neutron absorbing lines is a critical issue to achieve a good visibility of the grating-based phase imaging system. The source grating for a neutron Talbot-Lau interferometer is an array of Gadolinium (Gd) structures that are generally made by sputtering, photo-lithography, and chemical wet etching. However, it is very challenging to fabricate a Gd structure with sufficient neutron attenuation of approximately more than 20 μm using a conventional metal deposition method because of the slow Gd deposition rate, film stress, high material cost, and so on. In this article, we fabricated the source gratings for neutron Talbot-Lau interferometers by filling the silicon structure with Gadox particles. The new fabrication method allowed us a very stable and efficient way to achieve a much higher Gadox filled structure than a Gd film structure, and is even more suitable for thermal polychromatic neutrons, which are more difficult to stop than cold neutrons. The newly fabricated source gratings were tested at the polychromatic thermal neutron grating interferometer system of HANARO at the Korea Atomic Energy Research Institute, and the visibilities and images from the neutron phase imaging system with the new source gratings were compared with those fabricated by a Gd deposition method. [ABSTRACT FROM AUTHOR]

The installation of the 28 GHz electron cyclotron resonance ion source (ECRIS) ion implantation beamline was recently completed at the Korea Basic Science Institute. The apparatus contains a beam monitoring system and a sample holder for the ion implantation process. The new implantation system can function as a multipurpose tool since it can implant a variety of ions, ranging hydrogen to uranium, into different materials with precise control and with implantation areas as large as 1-10 mm2. The implantation chamber was designed to measure the beam properties with a diagnostic system as well as to perform ion implantation with an in situ system including a mass spectrometer. This advanced implantation system can be employed in novel applications, including the production of a variety of new materials such as metals, polymers, and ceramics and the irradiation testing and fabrication of structural and functional materials to be used in future nuclear fusion reactors. In this investigation, the first nitrogen ion implantation experiments were conducted using the new system. The 28 GHz ECRIS implanted low-energy, multi-charged nitrogen ions into copper, zinc, and cobalt substrates, and the ion implantation depth profiles were obtained. SRIM 2013 code was used to calculate the profiles under identical conditions, and the experimental and simulation results are presented and compared in this report. The depths and ranges of the ion distributions in the experimental and simulation results agree closely and demonstrate that the new system will enable the treatment of various substrates for advanced materials research. [ABSTRACT FROM AUTHOR]

We introduce an analyzer grating based on a structured scintillator fabricated by a gadolinium oxysulfide powder filling method for a symmetric Talbot-Lau neutron grating interferometer. This is an alternative way to analyze the Talbot self-image of a grating interferometer without using an absorption grating to block neutrons. Since the structured scintillator analyzer grating itself generates the signal for neutron detection, we do not need an additional scintillator screen as an absorption analyzer grating. We have developed and tested an analyzer grating based on a structured scintillator in our symmetric Talbot-Lau neutron grating interferometer to produce high fidelity absorption, differential phase, and dark-field contrast images. The acquired images have been compared to results of a grating interferometer utilizing a typical absorption analyzer grating with two commercial scintillation screens. The analyzer grating based on the structured scintillator enhances interference fringe visibility and shows a great potential for economical fabrication, compact system design, and so on. We report the performance of the analyzer grating based on a structured scintillator and evaluate its feasibility for the neutron grating interferometer. [ABSTRACT FROM AUTHOR]