1. Study on dark-field imaging with a laboratory x-ray source: Random stress variation analysis based on x-ray grating interferometry.
- Author
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Lee, Seho, Oh, Ohsung, Kim, Youngju, Kim, Daeseung, Won, Junhyeok, and Lee, Seung Wook
- Subjects
STRAINS & stresses (Mechanics) ,X-ray imaging ,SMALL-angle scattering ,STRESS concentration ,MECHANICAL properties of condensed matter ,INTERFEROMETRY ,PHASE-shifting interferometry - Abstract
The dark-field image (DFI) in a grating interferometer involves the small-angle scattering properties of a material. The microstructure of the material can be characterized by an analysis of the auto-correlation length and the DFI. The feasibility of a DFI in a laboratory x-ray source with grating interferometry has been reported, but a follow-up study is needed. In this study, the random stress distribution was measured in the laboratory environment as an applied study. SiO
2 mono-spheres as a cohesive powder with a 0.5 µm particle size were used as the sample. The microstructural changes according to the stresses on the particles were observed by acquiring a DFI along the auto-correlation length. In x-rays, a random two-phase media model was first used to analyze the characteristics of cohesive powder. This study showed that the microstructure of materials and x-ray images could be analyzed in a laboratory environment. [ABSTRACT FROM AUTHOR]- Published
- 2021
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