1. Note: Electron energy spectroscopy mapping of surface with scanning tunneling microscope.
- Author
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Meng Li, Chunkai Xu, Panke Zhang, Zhean Li, and Xiangjun Chen
- Subjects
ELECTRON energy loss spectroscopy ,SCANNING tunneling microscopy ,SCANNING probe microscopy ,TOPOGRAPHY ,ELECTRON beams - Abstract
We report a novel scanning probe electron energy spectrometer (SPEES) which combines a double toroidal analyzer with a scanning tunneling microscope to achieve both topography imaging and electron energy spectroscopy mapping of surface in situ. The spatial resolution of spectroscopy mapping is determined to be better than 0.7 ± 0.2 μm at a tip sample distance of 7 μm. Meanwhile, the size of the field emission electron beam spot on the surface is also measured, and is about 3.6 ± 0.8 μm in diameter. This unambiguously demonstrates that the spatial resolution of SPEES technique can be much better than the size of the incident electron beam. Published by AIP Publishing. [ABSTRACT FROM AUTHOR]
- Published
- 2016
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