1. XPS depth profiling of organic photodetectors with the gas cluster ion beam.
- Author
-
Haberko, Jakub, Marzec, Mateusz M., Bernasik, Andrzej, Łużny, Wojciech, Lienhard, Pierre, Pereira, Alexandre, Faure-Vincent, Jérôme, and Revaux, Amélie
- Subjects
PHOTODETECTORS ,X-ray photoelectron spectroscopy ,THIN films ,ION beams ,SPUTTERING (Physics) ,ARGON - Abstract
In this work, the authors study active layers of organic photodetector devices containing phenyl-C61- butyric acid methyl ester and Poly[(4,8-bis-(2-ethylhexyloxy)-benzo(1,2-b:4,5-b
' )dithiophene)-2,6- diyl-alt-(4-(2-ethylhexanoyl)-thieno[3,4-b]thiophene-)-2-6-diyl)] (PBDTTT-C). Thin films are examined by x-ray photoemission spectroscopy coupled with argon gas cluster ion sputtering. The use of massive cluster projectiles instead of monoatomic ions has the advantage of not destroying the chemical structure of organic materials under study. The authors show how simulated aging influences the chemistry of these blends and how these alterations extend from sample surface into the bulk of the film. The authors identify several possible processes resulting from aging, including C=O bond breakage and PBDTTT-C diffusion. [ABSTRACT FROM AUTHOR]- Published
- 2016
- Full Text
- View/download PDF