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A technique to measure a terahertz wave generated by spectrum tailored Fabry–Pérot lasers (FP) is assessed. A dc-biased and 25 °C temperature controlled FP is probed by a continuous wave signal, tuned at 20 nm away from its lasing modes. With a 0.02 nm resolution optical spectrum analyzer (OSA), the terahertz generated signal frequency is measured from the interval between the probe and its side-band modulations. The terahertz waves emitted by these FPs are measured at 370±5 GHz and at 1.157±0.005 THz, respectively, within a precision set by our OSA. The origin of the terahertz wave is due to passive mode-locked through intracavity four-wave-mixing processes.

We present results achieved in the generation of terahertz wave by a semiconductor laser. It is a Fabry–Pérot based device with shallow grooves implemented on its p-side to engineer the longitudinal mode spectrum. The laser is dc-biased and temperature controlled at 298 K. The main two modes are separated by 3 nm at 1550 nm with a side-mode-suppression ratio of 25 dB. Using a frequency resolved optical gating, evidence of mode beating at 373 GHz is observed. With a bolometer interfaced to a Fourier transform interferometer, the second harmonic signal is measured at 690 GHz.