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The recently demonstrated semiconductor grafting approach allows one to create an abrupt, low interface-trap-density heterojunction between a high-quality p-type single-crystalline semiconductor (non-nitrides) with n-type GaN. However, due to the surface band-bending from GaN polarization, an energy barrier exists at the grafted heterojunction, which can impact the vertical charge carrier transport. Reducing the energy barrier height is essential for some advanced device development. In this work, we employed UV/O3 and O2 plasma to treat a Ga-polar GaN surface with/without an ultrathin (∼2 nm) ALD-Al2O3 coating and studied the effects of the treatments on surface band-bending. Through XPS measurements, it was found that the treatments can suppress the upward band-bending of the Ga-polar GaN by 0.11–0.39 eV. The XPS results also showed that UV/O3 treatment is an effective surface cleaning method with little surface modification, while O2 plasma causes a strong oxidation process that occurs inside the top layer GaN. [ABSTRACT FROM AUTHOR]

Hydrogen sensing properties of a metamorphic high electron mobility transistor (MHEMT) are studied and presented. This MHEMT-based sensor exhibits good pinch-off characteristics upon exposing to hydrogen gases. Besides, the current variation and threshold voltage shift of the studied device reveal larger response under hydrogen-containing conditions. The studied device shows fast responses and exhibits a large current variation magnitude of the order of milliamperes and a relatively low sensitivity due to the high baseline current. Based on the Langmiur isotherm, experimental current responses are consistent with the simulated curve. This indicates that the surface reaction is the rate limited factor for this hydrogen adsorption reaction. [ABSTRACT FROM AUTHOR]

In addition to operating the imaging ellipsometric measurements by four-specific temporal phases in the photoelastic modulated ellipsometry, we added the fifth one to solve the initial phase of the photoelastic modulator. This methodology has been developed to conquer the slow imaging processing of charge-coupled device camera for the stroboscopic illumination in the polarization modulated imaging ellipsometry. Without any calibration in its initial phase, we can perform the ellipsometric measurement by the measurements of intensity at five-specific temporal phases. The intensities of a full cycle for a point on SiO2/Si thin film were measured and analyzed for verifying this algorithm. The five stroboscopic illuminations were performed to measure the two-dimensional distribution of the same SiO2/Si thin film. [ABSTRACT FROM AUTHOR]

The interesting hydrogen sensing properties of a Pt-oxide-GaN metal-oxide-semiconductor-type Schottky diode are comprehensively studied and demonstrated. In the hydrogen-containing environment, the shift in current-voltage curves and decrease in turn-on voltage are found to be caused by the lowering of Schottky barrier height. Also, the corresponding series resistance is decreased from 191.8 (in air) to 155.3 Ω (for a 9970 ppm H2/air gas) at 30 °C. As the carrier gas is replaced by a nitrogen gas, a significant variation of 0.32 V and 19.56 Ω in the turn-on voltage Von and series resistance Rs values, respectively, is obtained at 30 °C, even at an extremely low hydrogen concentration of 4.3 ppm H2/N2. Since the oxygen atoms will be dissolved on the Pt metal surface and react with hydrogen atoms by the formation of hydroxyl and water, the number of adsorbed hydrogen atoms on the Pt surface is reduced. Moreover, the shorter response time constant and the larger initial rate of current density variation are found even at room temperature. [ABSTRACT FROM AUTHOR]

The dc and electron impaction ionization characteristics of an InP/InGaAs double heterojunction bipolar transistor with a step-graded InAlGaAs collector structure are studied and reported. From the experiments, the studied device shows a better common-emitter breakdown voltage and lower output conductance at higher temperature operations. Due to the insertion of a step-graded InAlGaAs collector structure at the base-collector heterojunction, the usually observed switching and hysteresis phenomena in InP/InGaAs-based HBTs are not seen in the studied device. The temperature-dependent electron impact ionization characteristics are also investigated. Above all, the studied DHBT device provides the promise for millimeter-wave and power circuit applications. [ABSTRACT FROM AUTHOR]