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Your search keyword '"Ruckstuhl, T"' showing total 2 results
Start Over Author "Ruckstuhl, T" Publisher american physical society
2 results on '"Ruckstuhl, T"'

1. Nanometer axial resolution by three-dimensional supercritical angle fluorescence microscopy

Author

Winterflood, C M, Ruckstuhl, T, Verdes, D, Seeger, S, Winterflood, C M, Ruckstuhl, T, Verdes, D, and Seeger, S

Abstract

We report a noninvasive fluorescence microscopy method and demonstrate nanometer resolution along the optical axis. The technique is based on the influence of the microscope slide on the angular intensity distribution of fluorescence. Axial positions are determined by measuring the proportion of light emitted below the critical angle of total internal reflection, which behaves in a classical way, and light emitted above the critical angle, which is exponentially dependent on the distance of the fluorophore from the microscope slide.

Published
2010

2. Nanometer axial resolution by three-dimensional supercritical angle fluorescence microscopy.

Author

Winterflood CM, Ruckstuhl T, Verdes D, and Seeger S

Subjects
Animals, Mice, Microscopy, Fluorescence instrumentation, Microspheres, Microtubules, NIH 3T3 Cells, Nanotechnology instrumentation, Particle Size, Microscopy, Fluorescence methods, Nanotechnology methods
Abstract

We report a noninvasive fluorescence microscopy method and demonstrate nanometer resolution along the optical axis. The technique is based on the influence of the microscope slide on the angular intensity distribution of fluorescence. Axial positions are determined by measuring the proportion of light emitted below the critical angle of total internal reflection, which behaves in a classical way, and light emitted above the critical angle, which is exponentially dependent on the distance of the fluorophore from the microscope slide.

Published
2010
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