1. Depth-Resolved Magnetization Dynamics Revealed by X-Ray Reflectometry Ferromagnetic Resonance.
- Author
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Burn, D. M., Zhang, S. L., Yu, G. Q., Guang, Y., Chen, H. J., Qiu, X. P., van der Laan, G., and Hesjedal, T.
- Subjects
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X-ray reflectometry , *MAGNETIZATION , *SOFT X rays , *TIME-resolved spectroscopy , *FERROMAGNETIC resonance , *MULTILAYERS , *HETEROSTRUCTURES - Abstract
Magnetic multilayers offer diverse opportunities for the development of ultrafast functional devices through advanced interface and layer engineering. Nevertheless, a method for determining their dynamic properties as a function of depth throughout such stacks has remained elusive. By probing the ferromagnetic resonance modes with element-selective soft x-ray resonant reflectivity, we gain access to the magnetization dynamics as a function of depth. Most notably, using reflectometry ferromagnetic resonance, we find a phase lag between the coupled ferromagnetic layers in [CoFeB/MgO/Ta]4 multilayers that is invisible to other techniques. The use of reflectometry ferromagnetic resonance enables the time-resolved and depth-resolved probing of the complex magnetization dynamics of a wide range of functional magnetic heterostructures with absorption edges in the soft x-ray wavelength regime. [ABSTRACT FROM AUTHOR]
- Published
- 2020
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