1. On microscopic compositional and electrostatic properties of grain boundaries in polycrystalline CuIn[sub 1−x]Ga[sub x]Se[sub 2]
- Author
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Min Gao, Alex Zunger, Leonard J. Brillson, S. H. Goss, Miguel A. Contreras, Y. M. Strzhemechny, and M. J. Hetzer
- Subjects
Secondary ion mass spectrometry ,Auger electron spectroscopy ,Materials science ,Condensed matter physics ,Analytical chemistry ,Rectangular potential barrier ,Grain boundary ,Cathodoluminescence ,Work function ,Crystallite ,Electrical and Electronic Engineering ,Thin film ,Condensed Matter Physics - Abstract
We report on the microscopic characteristics of polycrystalline CuIn1−xGaxSe2 thin films probed with Auger electron spectroscopy, cathodoluminescence spectroscopy, secondary ion mass spectrometry, and work function measurements. Confirming theory, we find a substantial reduction in Cu content from grain interior to boundary and a p-type potential barrier that acts to reduce hole recombination. Such compositional and electrostatic variations between grain boundaries and grain interiors in CuIn1−xGaxSe2 solar cell absorber layers may improve the overall photovoltaic efficiency. The high degree of intergranular inhomogeneity emphasizes the importance of detailed grain-by-grain analysis. These results show that careful specimen preparation and ultrahigh vacuum conditions, coupled with nanoscale instrumental resolution, are pivotal for such analysis.
- Published
- 2006
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