1. Measurement of Interfacial Evolution in Three Dimensions.
- Author
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Rowenhorst, D.J. and Voorhees, P.W.
- Subjects
- *
POLYCRYSTALS , *POLYCRYSTALLINE semiconductors , *SEMICONDUCTORS , *SINTERING , *HOT working - Abstract
The experimental measurement of the evolution of interfaces in three dimensions is reviewed, concentrating on the evolution of polycrystalline and solid-liquid systems, including growth and coarsening in dendritic systems and evolution during liquid-phase sintering. Both ex situ destructive techniques and in situ nondestructive techniques are considered. The importance of making three-dimensional measurements that can be quantified and unambiguously compared with theory is discussed, showing that these measurements provide a direct validation of theory and critical initial conditions for simulations. [ABSTRACT FROM AUTHOR]
- Published
- 2012
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